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期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2006, vol.27, no.1 2006, vol.27, no.10 2006, vol.27, no.11 2006, vol.27, no.12 2006, vol.27, no.2 2006, vol.27, no.3
2006, vol.27, no.4 2006, vol.27, no.5 2006, vol.27, no.6 2006, vol.27, no.7 2006, vol.27, no.8 2006, vol.27, no.9

题名作者出版年年卷期
Planar Integration of E/D-Mode AlGaN/GaN HEMTs Using Fluoride-Based Plasma TreatmentRuonan Wang; Yong Cai; Wilson Tang; Kei May Lau; Kevin J. Chen20062006, vol.27, no.8
High-Efficiency Enhancement-Mode Power Heterojunction FET With Buried p{sup}+-GaAs Gate Structure for Low-Voltage-Operated Mobile ApplicationsYasunori Bito; Yoshiaki Yamakawa; Shinichi Tanaka; Naotaka Iwata20062006, vol.27, no.8
Structural Advantage for the EOT Scaling and Improved Electron Channel Mobility by Incorporating Dysprosium Oxide (Dy{sub}2O{sub}3) Into HfO{sub}2 n-MOSFETsTackhwi Lee; Se Jong Rhee; Chang Yong Kang; Feng Zhu; Hyoung-sub Kim; Changhwan Choi; Injo Ok; Manhong Zhang; Siddarth Krishnan; Gaurav Thareja; Jack C. Lee20062006, vol.27, no.8
Hafnium Silicate Nanocrystal Memory Using Sol-Gel-Spin-Coating MethodHsin-Chiang You; Tze-Hsiang Hsu; Fu-Hsiang Ko; Jiang-Wen Huang; Tan-Fu Lei20062006, vol.27, no.8
Linewidth Effect and Phase Control in Ni Fully Silicided GatesJ. A. Kittl; A. Lauwers; T. Hoffmann; A. Veloso; S. Kubicek; M. Niwa; M. J. H. van Dal; M. A. Pawlak; C. Demeurisse; C. Vrancken; B. Brijs; P. Absil; S. Biesemans20062006, vol.27, no.8
Fully Elastic Interconnects on Nanopatterned Elastomeric SubstratesPrashant Mandlik; Stephanie P. Lacour; Jason W. Li; Stephen Y. Chou; Sigurd Wagner20062006, vol.27, no.8
SONOS-Type Flash Memory Using an HfO{sub}2 as a Charge Trapping Layer Deposited by the Sol-Gel Spin-Coating MethodHsin-Chiang You; Tze-Hsiang Hsu; Fu-Hsiang Ko; Jiang-Wen Huang; Wen-Luh Yang; Tan-Fu Lei20062006, vol.27, no.8
UV Photo-Responsive Characteristics of an n-Channel GaN Schottky-Barrier MISFET for UV Image SensorsHeon-Bok Lee; Hyun-Su An; Hyun-Ick Cho; Jung-Hee Lee; Sung-Ho Hahm20062006, vol.27, no.8
Correlating Drain-Current With Strain-Induced Mobility in Nanoscale Strained CMOSFETsHong-Nien Lin; Hung-Wei Chen; Chih-Hsin Ko; Chung-Hu Ge; Horng-Chih Lin; Tiao-Yuan Huang; Wen-Chin Lee20062006, vol.27, no.8
Decoupling of Cold-Carrier Effects in Hot-Carrier Reliability Assessment of HfO{sub}2 Gated nMOSFETsHokyung Park; Rino Choi; Byoung Hun Lee; Seung-Chul Song; Man Chang; Chadwin D. Young; Gennadi Bersuker; Jack C. Lee; Hyunsang Hwang20062006, vol.27, no.8
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