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期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2007, vol.28, no.1 2007, vol.28, no.10 2007, vol.28, no.11 2007, vol.28, no.12 2007, vol.28, no.2 2007, vol.28, no.3
2007, vol.28, no.4 2007, vol.28, no.5 2007, vol.28, no.6 2007, vol.28, no.7 2007, vol.28, no.8 2007, vol.28, no.9

题名作者出版年年卷期
A 0.26-μm{sup}2 U-Shaped Nitride-Based Programming Cell on Pure 90-nm CMOS TechnologyHan-Chao Lai; Kai-Yuan Cheng; Ya-Chin King; Chrong-Jung Lin20072007, vol.28, no.9
Substrate Bias Effect Linked to Parasitic Series Resistance in Multiple-Gate SOI MOSFETsTamara Rudenko; Valeria Kilchytska; Nadine Collaert; Malgorzata Jurczak; Alexey Nazarov; Denis Flandre20072007, vol.28, no.9
CMOS Dual-Work-Function Engineering by Using Implanted Ni-FUSIChien-Ting Lin; Manfred Ramin; Michael Pas; Rick Wise; Yean-Kuen Fang; Che-Hua Hsu; Yao-Tsung Huang; Li-Wei Cheng; Mike Ma20072007, vol.28, no.9
Profiling of Nitride-Trap-Energy Distribution in SONOS Flash Memory by Using a Variable-Amplitude Low-Frequency Charge-Pumping TechniqueYi-Ying Liao; Sheng-Fu Horng; Yao-Wen Chang; Tao-Cheng Lu; Kuang-Chao Chen; Tahui Wang; Chin-Yuan Lu20072007, vol.28, no.9
High Mobility Strained Ge pMOSFETs With High-κ/Metal GateGareth Nicholas; T. J. Grasby; D. J. F. Fulgoni; C. S. Beer; J. Parsons; M. Meuris; M. M. Heyns20072007, vol.28, no.9
Valence Band Offset Measurements on Thin Silicon-on-Insulator MOSFETsJ. L. P. J. van der Steen; R. J. E. Hueting; G. D. J. Smit; T. Hoang; J. Holleman; J. Schmitz20072007, vol.28, no.9
Measurement of Channel Stress Using Gate Direct Tunneling Current in Uniaxially Stressed nMOSFETsChen-Yu Hsieh; Ming-Jer Chen20072007, vol.28, no.9
PMOSFET Reliability Study for Direct Silicon Bond (DSB) Hybrid Orientation Technology (HOT)Yao-Tsung Huang; Angelo Pinto; Chien-Ting Lin; Che-Hua Hsu; Manfred Ramin; Mike Seacrist; Mike Ries; Kenneth Matthews; Billy Nguyen; Melissa Freeman; Bruce Wilks; Chuck Stager; Charlene Johnson; Laurie Denning; Joe Bennett; Sachin Joshi20072007, vol.28, no.9
Gate Voltage Dependence of MOSFET 1/f Noise StatisticsMete Erturk; Tian Xia; William F. Clark20072007, vol.28, no.9
A Novel Nanowire Channel Poly-Si TFT Functioning as Transistor and Nonvolatile SONOS MemoryShih-Ching Chen; Ting-Chang Chang; Po-Tsun Liu; Yung-Chun Wu; Po-Shun Lin; Bae-Heng Tseng; Jang-Hung Shy; S. M. Sze; Chun-Yen Chang; Chen-Hsin Lien20072007, vol.28, no.9
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