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期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2007, vol.28, no.1 2007, vol.28, no.10 2007, vol.28, no.11 2007, vol.28, no.12 2007, vol.28, no.2 2007, vol.28, no.3
2007, vol.28, no.4 2007, vol.28, no.5 2007, vol.28, no.6 2007, vol.28, no.7 2007, vol.28, no.8 2007, vol.28, no.9

题名作者出版年年卷期
Experimental Study of Data Retention in Nitride Memories by Temperature and Field AccelerationChristian Monzio Compagnoni; Alessandro S. Spinelli; Andrea L. Lacaita20072007, vol.28, no.7
Body Thickness Dependence of Impact Ionization in a Multiple-Gate FinFETJin-Woo Han; Jiye Lee; Donggun Park; Yang-Kyu Choi20072007, vol.28, no.7
A Novel Dual-Doping Floating-Gate (DDFG) Flash Memory Featuring Low Power and High Reliability ApplicationYan Li; Ru Huang; Yimao Cai; Falong Zhou; Xiaonan Shan; Xing Zhang; Yangyuan Wang20072007, vol.28, no.7
Nitrogen Incorporation in HfSiO(N)/TaN Gate Stacks: Impact on Performances and NBTIMarc Aoulaiche; M. Houssa; W. Deweerd; L. Trojman; T. Conard; J. W. Maes; S. De Gendt; Guido Groeseneken; Herman E. Maes; M. M. Heyns20072007, vol.28, no.7
Experimental and TCAD Investigation of the Two Components of the Impact Ionization MOSFET (IMOS) SwitchingF. Mayer; C. Le Royer; G. Le Carval; L. Clavelier; S. Deleonibus20072007, vol.28, no.7
Effect of SiN{sub}x Gate Dielectric Deposition Power and Temperature on a-Si:H TFT StabilityAlex Z. Kattamis; Kunigunde H. Cherenack; Bahman Hekmatshoar; I-Chun Cheng; Helena Gleskova; James C. Sturm; Sigurd Wagner20072007, vol.28, no.7
Strained n-Channel Transistors With Silicon Source and Drain Regions and Embedded Silicon/Germanium as Strain-Transfer StructureKah-Wee Ang; Chin-Hang Tung; N. Balasubramanian; Ganesh S. Samudra; Yee-Chia Yeo20072007, vol.28, no.7
Symmetric Vertical Parallel Plate Capacitors for On-Chip RF Circuits in 65-nm SOI TechnologyDaeik Kim; Jonghae Kim; Jean-Olivier Plouchart; Choongyeun Cho; Robert Trzcinski; Mahender Kumar; Christine Norris20072007, vol.28, no.7
On the Enhanced Impact Ionization in Uniaxial Strained p-MOSFETsPin Su; Jack J.-Y. Kuo20072007, vol.28, no.7
Ferrite-Integrated On-Chip Inductors for RF ICsChen Yang; Feng Liu; Tian-Ling Ren; Li-Tian Liu; Guang Chen; Xiao-Kang Guan; Albert Wang; Hai-Gang Feng20072007, vol.28, no.7
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