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期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2007, vol.28, no.1 2007, vol.28, no.10 2007, vol.28, no.11 2007, vol.28, no.12 2007, vol.28, no.2 2007, vol.28, no.3
2007, vol.28, no.4 2007, vol.28, no.5 2007, vol.28, no.6 2007, vol.28, no.7 2007, vol.28, no.8 2007, vol.28, no.9

题名作者出版年年卷期
On the Low-Frequency Noise of pMOSFETs With Embedded SiGe Source/Drain and Fully Silicided Metal GateE. Simoen; P. Verheyen; A. Shickova; R. Loo; C. Claeys20072007, vol.28, no.11
Impact of Local Strain From Selective Epitaxial Germanium With Thin Si/SiGe Buffer on High-Performance p-i-n Photodetectors With a Low Thermal BudgetW. Y. Loh; J. Wang; J. D. Ye; R. Yang; H. S. Nguyen; K. T. Chua; J. F. Song; T. H. Loh; Y. Z. Xiong; S. J. Lee; M. B. Yu; G. Q. Lo; D. L. Kwong20072007, vol.28, no.11
Improved Electrical Characteristics and Reliability of MILC Poly-Si TFTs Using Fluorine-Ion ImplantationChih-Pang Chang; YewChung Sermon Wu20072007, vol.28, no.11
Achieving Low-V{sub}T Ni-FUSI CMOS by Ultra-Thin Dy{sub}2O{sub}3 Capping of Hafnium Silicate DielectricsA. Veloso; H. Y. Yu; S. Z. Chang; C. Adelmann; B. Onsia; S. Brus; M. Demand; A. Lauwers; B. J. O'Sullivan; R. Singanamalla; G. Pourtois; P. Lehnen; S. Van Elshocht; K. De Meyer; M. Jurczak; P. P. Absil; S. Biesemans20072007, vol.28, no.11
A Simple Spacer Technique to Fabricate Poly-Si TFTs With 50-nm Nanowire ChannelsChia-Wen Chang; Chin-Kang Deng; Hong-Ren Chang; Che-Lun Chang; Tan-Fu Lei20072007, vol.28, no.11
A Phase Change Memory Compact Model for Multilevel ApplicationsD. Ventrice; P. Fantini; Andrea Redaelli; A. Pirovano; A. Benvenuti; F. Pellizzer20072007, vol.28, no.11
Effects of Sulfur Passivation on Germanium MOS Capacitors With HfON Gate DielectricRuilong Xie; Chunxiang Zhu20072007, vol.28, no.11
Metal-Oxide-High-k, Dielectric-Oxide-Semiconductor (MOHOS) Capacitors and Field-Effect Transistors for Memory ApplicationsHsin-hao Hsu; Ingram Yin-ku Chang; Joseph Ya-min Lee20072007, vol.28, no.11
Young's Modulus Measurements in Standard IC CMOS Processes Using MEMS Test StructuresJanet C. Marshall; David L. Herman; P. Thomas Vernier; Don L. DeVoe; Michael Gaitan20072007, vol.28, no.11
Current-Dependent Switching Characteristics of PI-Diphenyl Carbamyl FilmsMijung Kim; Seungchel Choi; Moonhor Ree; Ohyun Kim20072007, vol.28, no.11
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