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期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告：硅器件和材料
收藏年代2000～2023



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2000 2001 2002 2009 2013 2014
2015 2017 2020 2021 2022 2023

2001, vol.101, no.107 2001, vol.101, no.108 2001, vol.101, no.246 2001, vol.101, no.247 2001, vol.101, no.320 2001, vol.101, no.321
2001, vol.101, no.350 2001, vol.101, no.430 2001, vol.101, no.515 2001, vol.101, no.571 2001, vol.101, no.573 2001, vol.101, no.718
2001, vol.101, no.719

题名作者出版年年卷期
Imaging of spontaneous polarization in Bi-based ferroelectric thin film by scanning force microscopyDesheng Fu; Kazuyuki Suzuki; Kazumi Kato20012001, vol.101, no.719
Ferroelectric properties of SrBi{sub}2Ta{sub}2O{sub}9 thin films deposited by RF magnetron sputteringTokuyuki Nakayama; Shoji Takanashi; Yuji Takatsuka20012001, vol.101, no.719
Property design of Bi{sub}4Ti{sub}3O{sub}12 - based thin films using site-engineering conceptHiroshi Funakubo; Takayuki Watanabe; Tomohiro Sakai; Takashi Kojima; Minoru Osada; Yuji Noguchi; Masaru Miyayama; Takashi Iijima; Hirofumi Matsuda; Hiroshi Uchida; Isao Okada20012001, vol.101, no.719
TEM investigation of 90° domain structure of PZT thin films and related ferroelectric propertyTakanori Kiguchi; Naoki Wakiya; Kazuo Shinozaki; Nobuyasu Mizutani20012001, vol.101, no.719
Non-linear model of FeRAM reliability including depolarization effectNaoya Inoue; Yoshihiro Hayahi20012001, vol.101, no.719
Proposal and analysis of novel non-volatile ferroelectric latch circuit for low operation voltageShuu'ichirou Yamamoto; Susumu Inoue; Hiroshi Ishiwara20012001, vol.101, no.719
Trends of embedded FRAM technologySeigen Otani; Tooru Endo20012001, vol.101, no.718
1T2C-type ferroelectric memorySatoru Ogasawara; Hiroshi Ishiwara20012001, vol.101, no.718
Characterization of metal-ferroelectric-metal-insulator-semiconductor (MFMIS) structures using (Bi,La){sub}4Ti{{sub}3O{sub}12 and high capacitance buffer layersTakuya Suzuki; Eisuke Tokumitsu20012001, vol.101, no.718
Change of MFIS characteristics of Bi{sub}4Ti{sub}3O{sub}12 thin film compositionsMasaki Yamaguchi; Takao Nagatomo; Yoichiro Masuda20012001, vol.101, no.718
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