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期刊


ISSN0741-3106
刊名IEEE Electron Device Letters
参考译名IEEE电子器件快报
收藏年代1998～2007



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007

2004, vol.25, no.1 2004, vol.25, no.10 2004, vol.25, no.11 2004, vol.25, no.12 2004, vol.25, no.2 2004, vol.25, no.3
2004, vol.25, no.4 2004, vol.25, no.5 2004, vol.25, no.6 2004, vol.25, no.7 2004, vol.25, no.8 2004, vol.25, no.9

题名作者出版年年卷期
An Intrinsic Delay Extraction Method for Schottky Gate Field Effect TransistorsTetsuya Suemitsu20042004, vol.25, no.10
Investigation of Breakdown and DC Behavior in HBTs With (Al,Ga)As Collector LayerAndre MaaBdorf; Paul Kurpas; Frank Brunner; Markus Weyers; Gunther Trankle20042004, vol.25, no.10
InGaAs-InP Metamorphic DHBTs Grown on GaAs With Lattice-Matched Device Performance and f{sub}T, f{sub}(max) > 268 GHzZach Griffith; YoungMin Kim; Mattias Dahlstrom; Arthur C. Gossard; Mark J. W. Rodwell20042004, vol.25, no.10
Resonant Tunneling Permeable Base Transistors With High TransconductanceErik Lind; Peter Lindstrom; Lars-Erik Wernersson20042004, vol.25, no.10
Evidence and Understanding of ALD Laminate MIM Capacitors Outperforming Sandwich CounterpartsShi-Jin Ding; Hang Hu; Chunxiang Zhu; M. F. Li; S. J. Kim; Byung Jin Cho; D. S. H. Chan; M. B. Yu; A. Y. Du; Albert Chin; D.-L. Kwong20042004, vol.25, no.10
Electronic Switching Effect and Phase-Change Transition in Chalcogenide MaterialsA. Redaelli; A. Pirovano; F. Pellizzer; A. L. Lacaita; D. lelmini; R. Bez20042004, vol.25, no.10
Quality Improvement of Ultrathin Gate Oxide by Using Thermal Growth Followed by SF ANO TechniqueYi-Lin Yang; Jenn-Gwo Hwu20042004, vol.25, no.10
A New Voltage-Modulated AMOLED Pixel Design Compensating for Threshold Voltage Variation in Poly-Si TFTsSang-Hoon Jung; Woo-Jin Nam; Min-Koo Han20042004, vol.25, no.10
Ge Outdiffusion Effect on Flicker Noise in Strained-Si nMOSFETsW.-C. Hua; M. H. Lee; P. S. Chen; S. Maikap; C. W. Liu; K. M. Chen20042004, vol.25, no.10
Numerical Simulation of Electron Transport Through Constriction in a Metallic Thin FilmSiva P. Gurrum; Yogendra K. Joshi; William P. King; Konem Ramakrishna20042004, vol.25, no.10
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