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期刊


ISSN2043-0647
刊名Microscopy and Analysis
参考译名显微镜学与分析——亚太版
收藏年代2008~2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2016 2016, no.Suppl.

题名作者出版年年卷期
Three-dimensional characterization of polymeric materials using a Talbot-Lau grating interferometer CTSascha Senck; Christian Gusenbauer; Bernhard Plank; Dietmar Salaberger; Johann Kastner20162016
TEM and HAADF-STEM investigations on the effect of Cu and Ge additions on precipitation in 6xxx Al alloysE. A. Mortsell; C. D. Marioara; S. J. Andersen; J. Royset; O. Reiso; R. Holmestad20162016
Bringing electron microscopy to lifeJames Whisstock20162016
Electron microscopy exposes brain activityChris Parmenter20162016
Tracking how sperm movesChris Parmenter20162016
Fast AFM for soft materialsChris Parmenter20162016
Tomography drives drug deliveryChris Parmenter20162016
Sensor locates cellular chemicalsChris Parmenter20162016
STEM points to better batteriesChris Parmenter20162016
Molecules in motionStan Burgess20162016
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