长垣产业园区科技文献服务平台

期刊


ISSN2043-0647
刊名Microscopy and Analysis
参考译名显微镜学与分析——亚太版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2012 2012, vol.2012 2012, vol.2012, no.SUPPL.

题名作者出版年年卷期
Andor TechnologyRay J. Boucher20122012, vol.2012, no.SUPPL.
2011 under the Microscope: A Review of New Technology and InstrumentsJulian P. Heath20122012, vol.2012, no.SUPPL.
Thermo Scientific: Efficient Operation and Confident ResultsRay J. Boucher20122012, vol.2012, no.SUPPL.
TESCAN, a.s.Ray J. Boucher20122012, vol.2012, no.SUPPL.
Park Systems: The leading nanotechnology solutions provider for nanoscale measurementsRay J. Boucher20122012, vol.2012, no.SUPPL.
Oxford Instruments Nano Analysis: Leading-edge tools enabling materials characterisation and sample manipulation at the nanometre scaleRay J. Boucher20122012, vol.2012, no.SUPPL.
Olympus Soft Imaging SolutionsRay J. Boucher20122012, vol.2012, no.SUPPL.
NT-MDTRay J. Boucher20122012, vol.2012, no.SUPPL.
FEIRay J. Boucher20122012, vol.2012, no.SUPPL.
Electron Microscopy SciencesRay J. Boucher20122012, vol.2012, no.SUPPL.
1234567



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  机械工业信息研究院 2018-2024