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期刊
ISSN
2043-0647
刊名
Microscopy and Analysis
参考译名
显微镜学与分析——亚太版
收藏年代
2008~2016
全部
2008
2009
2010
2011
2012
2013
2014
2015
2016
2008, no.61
2008, no.63
2008, no.64
2008, no.65
2008, no.66
题名
作者
出版年
年卷期
Application of Optimum HRTEM Noise Filters in Mineralogy and Related Sciences
Toshihiro Kogure; Paul H. C. Eilers; Kazuo Ishizuka
2008
2008, no.66
A Cryo-Transmission Electron Microscopy Study of Asymmetric PMMA Copolymers
Christopher Parmenter; Svetla Stoilova-McPhie; Stefan Bon
2008
2008, no.66
Morphology, Physicochemistry and Phase Analysis of Neuburg Siliceous Earth
Jurgen Goske; Werner Kachler
2008
2008, no.65
Characterization of the Microstructural Aspects of Machinable α-β Phase Brass
G. Pantazopoulos; A. Vazdirvanidis
2008
2008, no.65
Noise and Colocalization in Fluorescence Microscopy: Solving a Problem
Jeremy Adler; Fredrik Bergholm; Stamatis N. Pagakis; Ingela Parmryd
2008
2008, no.65
Fractography of Brittle Materials: Analysis of Fractures in Ceramics and Glasses
George D. Quinn
2008
2008, no.64
Microscopy of Semiconductor Nano- and Microwires with Waveguiding Behaviour
Javier Piqueras; Pedro Hidalgo; Emilio Nogales; Bianchi Mendez; Jose Angel Garcia
2008
2008, no.64
Advanced Monochromatic STEM for Nano-Electronics Industry Applications
C. H. Tung; M. Bosman; C. K. Cheng
2008
2008, no.64
Electron Microscope Cameras
Julian P. Heath
2008
2008, no.63
Green LED Array Modules
Julian P. Heath
2008
2008, no.63
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