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期刊
ISSN
2043-0647
刊名
Microscopy and Analysis
参考译名
显微镜学与分析——亚太版
收藏年代
2008~2016
全部
2008
2009
2010
2011
2012
2013
2014
2015
2016
2015
2015, no.Suppl.
题名
作者
出版年
年卷期
Fast quantitative AFM nano-mechanical measurements using AM-FM Viscoelastic Mapping Mode
Donna Hurley; Marta Kocun; Irene Revenko; Ben Ohler; Roger Proksch
2015
2015, no.Suppl.
Applications of AFM-based nanoscale infrared spectroscopy: A conducting polymer and an amyloid-like protein
Curtis Marcott; Alexandre Dazzi; Samy Remita; Francesco Simone Ruggeri; Giovanni Dietler; Yves Jacquot
2015
2015, no.Suppl.
Correlative SPM, Raman and SEM analytic of biomedical devices and coatings
M. Martina; S. Rohler; P. Ingrino; C. J. Burkhardt
2015
2015, no.Suppl.
WITec: Imaging of vessels with combined Raman-AFM Imaging
Chris Parmenter
2015
2015, no.Suppl.
OXFORD INSTRUMENTS: Measuring surface roughness with AFM
Chris Parmenter
2015
2015, no.Suppl.
OXFORD INSTRUMENTS: AFM-based microrheology on cells with the Asylum Research MFP-3D-BIO
Chris Parmenter
2015
2015, no.Suppl.
HITACHI HIGH-TECH SCIENCE: SEM and SPM comparative measurements without air exposure
Chris Parmenter
2015
2015, no.Suppl.
BRUKER NANO SURFACES
Chris Parmenter
2015
2015, no.Suppl.
Bruker microCT
Chris Parmenter
2015
2015, no.Suppl.
Evactron By XEI Scientific
Chris Parmenter
2015
2015, no.Suppl.
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