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期刊


ISSN2043-0647
刊名Microscopy and Analysis
参考译名显微镜学与分析——亚太版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2012 2012, vol.2012 2012, vol.2012, no.SUPPL.

题名作者出版年年卷期
Force Scanning for Simultaneous Collection of Topographical and Mechanical PropertiesEric M. Darling; Hetal V. Desai20122012
Using Scientific CMOS Technology for Fast 3D Imaging with Selective-Plane IlluminationUros Krzic20122012
Digital Camera Technologies for Scientific Bio-Imaging. Part 4: Signal-to-Noise Ratio and Image Comparison of CamerasYashvinder Sabharwal20122012
Analysis of Particle Size Distribution of Supported Catalyst by HAADF-STEMBingsen Zhang; Wei Zhang; Dang Sheng Su20122012
3D Chemical Mapping using Tomography with an Enhanced XEDS SystemArda Genc; Huikai Cheng; Jonathan Winterstein; Lee Pullan; Bert Freitag20122012
Using X-Ray Microtomography for the Three Dimensional Mapping of MineralsAlbina Mutina; Dmitry Koroteev20122012
Applications of Micro-CT to In-situ Foam Compression and Numerical ModelingBrian M. Patterson; Kevin Henderson; Zachary Smith; Duan Zhang; Paul Giguere20122012
A Study of Bubbles in Foods by X-Ray Microtomography and Image AnalysisGerard van Dalen20122012
Applications of Atomic Force Microscopy and Single-Cell Force Spectroscopy in Cell Adhesion ResearchClemens M. Franz20122012
Measuring Electrical Properties of Layered Graphene with Kelvin Force MicroscopyJing-Jiang Yu; Shijie Wu20122012
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