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期刊


ISSN2043-0647
刊名Microscopy and Analysis
参考译名显微镜学与分析——亚太版
收藏年代2008～2016



全部

2008 2009 2010 2011 2012 2013
2014 2015 2016

2014 2014, no.Suppl. 2014, no.Suppl.1

题名作者出版年年卷期
Electron Microscopy SciencesJulian P. Heath20142014, no.Suppl.
FEI: Finding meaningful answers to questions that change the worldJulian P. Heath20142014, no.Suppl.
Hitachi High-TechnologiesJulian P. Heath20142014, no.Suppl.
LumeneraJulian P. Heath20142014, no.Suppl.
NanoMEGAS: Next generation advanced TEM applications enabled with precession electron diffractionJulian P. Heath20142014, no.Suppl.
Park Systems: The leading nanotechnology solutions provider for nanoscale measurementsJulian P. Heath20142014, no.Suppl.
TESCAN ORSAY HOLDINGJulian P. Heath20142014, no.Suppl.
Carl Zeiss Microscopy: From microscopes to complete solutionsJulian P. Heath20142014, no.Suppl.
JPK Instruments AGJulian P. Heath20142014, no.Suppl.
PCO: A world leading manufacturer of scientific camera systems with sCMOS, CCD and CMOS sensor technologyJulian P. Heath20142014, no.Suppl.
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