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期刊
ISSN
2043-0647
刊名
Microscopy and Analysis
参考译名
显微镜学与分析——亚太版
收藏年代
2008~2016
全部
2008
2009
2010
2011
2012
2013
2014
2015
2016
2009
2009, no. tn68
2009, no.2009 suppl
2009, no.67
2009, no.70
题名
作者
出版年
年卷期
Scanning Probe Microscopy of Palladium and Nickel Islands on Gallium Nitride
Christiane Norenberg; Sverre Myhra; Peter Dobson
2009
2009
Applications of Atomic Force Microscopy in Pharmaceutical Research
Clive J. Roberts
2009
2009
Bimodal Atomic Force Microscopy Imaging of Collagen Fiber Ultrastructure
Elena Tomas Herruzo; Ricardo Garcia; Roger B. Proksch; Irene Revenko; Monteith G. Heaton
2009
2009
Applications of Single- and Double-Walled Carbon Nanotube SPM Probes
Julian P. Heath
2009
2009
Scanning Ion Conductance Microscopy: Non-Contact Imaging and Electrophysiology
Y.-K. Yoo; K.-D. Ryang; S.-J. Cho
2009
2009
Combined Raman Imaging and High Resolution AFM of Carbon Nanotubes
U. Schmidt; T. Dieing; A. Jauss; H. Fischer; O. Hollricher
2009
2009
Improved DQE for TEM Imaging Plates by Correction of Geometric Distortion
Petra Bele
2009
2009
Applications of Helium Ion Microscopy in Semiconductor Manufacturing
Rainer Reiche; Rainer Kaesmaier; Rudiger Rosenkranz; Uwe Ritter; Steffen Teichert; Susann Leinert
2009
2009
Scanning Electron Microscopical Analysis of Incandescent Lamp Tungsten Filaments
Syed Nasimul Alam
2009
2009
Variable Pressure and Environmental SEM of Thin-Film Liquid Crystal/Polymer Composites
Kashma K. Rai; Sameet K. Shriyan; Adam K. Fontecchio
2009
2009
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