长垣产业园区科技文献服务平台

期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002~2023



全部

2002 2003 2004 2005 2006 2007
2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018 2019
2020 2021 2022 2023

2007, vol.36, no.1 2007, vol.36, no.2 2007, vol.36, no.3 2007, vol.36, no.4 2007, vol.36, no.5 2007, vol.36, no.6

题名作者出版年年卷期
Simulating Quantum Dynamics in Terms of Classical Collective BehaviorY. I. Ozhigov20072007, vol.36, no.3
Zn-P Complex in Si: An Ab-initio Calculation of the Structure and Electron-Spin PropertiesA. I. Aleksandrov; S. N. Dobryakov; V. V. Privezentsev20072007, vol.36, no.3
Polymer Surface Deformation under Semicontact-Mode AFM ScanningA. B. Petrov; R. R. Gallyamov20072007, vol.36, no.3
Phosphomolybdic Acid-Assisted Thermal Oxidation of GaAsI. Ya. Mittova; S. S. Lavrushina; E. V. Lebedeva; A. V. Popelo20072007, vol.36, no.3
Plasma Etching of poly-Si/SiO{sub}2/Si Structures: Langmuir-Probe and Optical-Emission-Spectroscopy MonitoringK. V. Rudenko; A. V. Myakon'kikh; A. A. Orlikovsky20072007, vol.36, no.3
Effect of Doping on the Temperature Coefficient of Resistance of Polysilicon FilmsA. A. Kovalevskii; A. V. Dolbik; S. N. Voitekh20072007, vol.36, no.3
Transformation of a Gaussian Doping Profile in a Temperature Field as Influenced by the Temperature Dependence of the Diffusion CoefficientV. V. Ovcharov; V. I. Rudakov20072007, vol.36, no.3
C-V and I-V Characteristics of Ultrathin-Oxide MOS Structures: Identification and AnalysisA. G. Zhdan; G. V. Chucheva; V. G. Naryshkina20072007, vol.36, no.3
Submicrometer Josephson Junction as a Sensor of Current States in a Mesoscopic Superconducting StructureI. N. Zhilyaev20072007, vol.36, no.3