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期刊


ISSN0957-4522
刊名Journal of Materials Science
参考译名材料科学杂志：电子材料
收藏年代1999～2013



全部

1999 2000 2001 2002 2003 2004
2005 2006 2007 2008 2009 2010
2011 2012 2013

2001, vol.12, no.1 2001, vol.12, no.10 2001, vol.12, no.11 2001, vol.12, no.12 2001, vol.12, no.2 2001, vol.12, no.4-5-6
2001, vol.12, no.7 2001, vol.12, no.8 2001, vol.12, no.9

题名作者出版年年卷期
III-nitride semiconductor growth by MBE: recent issuesHadis Morkoc20012001, vol.12, no.12
Characterization of laser annealed polycrystalline silicon films on various substratesChung Yi; Shi-Woo Rhee; Jin-Ho Ju; Sung-Kyun Yim; Hoonkee Min20012001, vol.12, no.12
Electrical properties of Pd-Au/(In{sub)-Sn{sub}(1-x)) oxide/Si(p)/Al heterojunction diodesM. A. Ahmed; I. Mekkawy; A. A. Azab20012001, vol.12, no.12
Effect of the addition of Y{sub}2{sub}3 on the structure, microstructure and piezoelectric properties of PZT(53/47)A. Beitollahi Ch. Khezri20012001, vol.12, no.12
Self-extinguishing epoxy molding compound with no flame-retarding additives for electronic componentsMasatoshi Iji; Yukihiro Kiuchi20012001, vol.12, no.12
Ellipsometry study of InN thin films prepared by magnetron sputteringF. Li; D. Mo; C. B. Cao; Y. L. Zhang; H. L. W. Chan; C. L. Choy20012001, vol.12, no.12
Dielectric and ferroelectric properties of Ba{sub}3M{sub}3Ti{sub}5Nb{sub}5O{sub}30(M = Sm or Y) ceramicsP. Prabhakar Rao; S. K. Ghosh; Peter Koshy20012001, vol.12, no.12
Growth and characterization of Zn{sub}(1-x)Mg{sub}xS thin films for electroluminescent applicationsM. K. Jayaraj20012001, vol.12, no.12
Stability of chromium diffusion barriers during anodic bonding in silicon resistor devicesConstance Williams; Hugo F. Lopez20012001, vol.12, no.12



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