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期刊


ISSN0957-4522
刊名Journal of Materials Science
参考译名材料科学杂志:电子材料
收藏年代1999~2013



全部

1999 2000 2001 2002 2003 2004
2005 2006 2007 2008 2009 2010
2011 2012 2013

2003, vol.14, no.1 2003, vol.14, no.10-12 2003, vol.14, no.2 2003, vol.14, no.3 2003, vol.14, no.4 2003, vol.14, no.5-6-7
2003, vol.14, no.8 2003, vol.14, no.9

题名作者出版年年卷期
Fabrication of thin films of bismuth selenide using novel single-source precursors by metal organic chemical vapor depositionJ. Waters; D. Crouch; P. O'Brien; Jin-Ho Park20032003, vol.14, no.9
In situ studies of the MBE growth of III-V systems using RHEED and STMB. A. Joyce20032003, vol.14, no.9
Single-crystal growth of La{sub}(2-2x)Sr{sub}(1+2x)Mn{sub}2O{sub}7 under pressureD. Prabhakaran; A. T. Boothroyd20032003, vol.14, no.9
Growth and magnetic characterization of large R{sub}2NiO{sub}(4+δ)(R=Pr, Nd) single crystalsD. Prabhakaran; A. T. Boothroyd; D. Gonzalez20032003, vol.14, no.9
Novel wet-chemical routes to highly structured semiconductor layers for improved efficiency photovoltaic devicesD. Berhanu; D. S. Boyle; K. Govender; P. O'Brien20032003, vol.14, no.9
The structural features of TiO{sub}2 thin films formed by pyrosol methodsK. D. Rogers; D. W. Lane; A. J. Chapman; J. D. Painter20032003, vol.14, no.9
r. f. sputtering of high-quality Cu/In precursor layers and conversion to CuInS{sub}2 using elemental sulfidization processesI. Forbes; K. T. Ramakrishna Reddy; D. Johnston; R. W. Miles; D. W. Lane; K. D. Rogers; A. Chapman20032003, vol.14, no.9
In situ and ex situ stress measurements of YF{sub}3 single layer optical coatings deposited by electron beam evaporatorV. Barrioz; S. J. C. Irvine; D. P. Jones20032003, vol.14, no.9
Metal-organic chemical vapor deposition of β-In{sub}2S{sub}3 thin films using a single-source approachM. Afzaal; D. Crouch; P. O'Brien; Jin-Ho Park20032003, vol.14, no.9
In situ optical monitoring of layer composition in the chemical beam epitaxy of AlGaAs from amine-alane sourcesT. B. Joyce20032003, vol.14, no.9
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