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期刊


ISSN0018-9456
刊名IEEE Transactions on Instrumentation and Measurement
参考译名IEEE测试设备与测量汇刊
收藏年代1998～2013

关联期刊参考译名收藏年代
IEEE Transactions on Instrumentation and MeasurementIEEE测试设备与测量汇刊 


全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013

2008, vol.57, no.1 2008, vol.57, no.10 2008, vol.57, no.11 2008, vol.57, no.12 2008, vol.57, no.2 2008, vol.57, no.3
2008, vol.57, no.4 2008, vol.57, no.5 2008, vol.57, no.6 2008, vol.57, no.7 2008, vol.57, no.8 2008, vol.57, no.9

题名作者出版年年卷期
Using a Recursive Rational Filter to Enhance Color ImagesStefano Marsi; Gaetano Impoco; Anna Ukovich; Giovanni Ramponi; Sergio Carrato20082008, vol.57, no.6
A Simple Recursive Algorithm for Simultaneous Magnitude and Frequency EstimationMiodrag D. Kusljevic20082008, vol.57, no.6
Improved Particle Image Velocimetry Through Cell Segmentation and Competitive SurvivalMuguo Li; Hai Du; Qun Zhang; Jing Wang20082008, vol.57, no.6
Systematic-Error Signals in the AC Josephson Voltage Standard: Measurement and ReductionRegis Pinheiro Landim; Samuel P. Benz; Paul D. Dresselhaus; Charles J. Burroughs, Jr.20082008, vol.57, no.6
Robust Filtering for TDR TracesPhilippe Neveux; Eric Blanco20082008, vol.57, no.6
Power Quality Factor for Networks Supplying Unbalanced Nonlinear LoadsDaniel Sharon; Juan-Carlos Montano; Antonio Lopez; Manuel Castilla; Dolores Borras; Jaime Gutierrez20082008, vol.57, no.6
Random Errors in Time Interval Measurement Based on SAW Filter ExcitationPetr Panek20082008, vol.57, no.6
Grey Distance Information Approach for Parameter Estimation of Small SamplesChen Yongguang; Ke Hongfa; Liu Yi20082008, vol.57, no.6
A New Method for RTS Noise of Semiconductor Devices IdentificationAlicja Konczakowska; Jacek Cichosz; Arkadiusz Szewczyk20082008, vol.57, no.6
Robust and Accurate Surface Measurement Using Structured LightRongqian Yang; Sheng Cheng; Wei Yang; Yazhu Chen20082008, vol.57, no.6
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