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期刊


ISSN0018-9456
刊名IEEE Transactions on Instrumentation and Measurement
参考译名IEEE测试设备与测量汇刊
收藏年代1998~2013

关联期刊参考译名收藏年代
IEEE Transactions on Instrumentation and MeasurementIEEE测试设备与测量汇刊 


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1998 1999 2000 2001 2002 2003
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2008, vol.57, no.1 2008, vol.57, no.10 2008, vol.57, no.11 2008, vol.57, no.12 2008, vol.57, no.2 2008, vol.57, no.3
2008, vol.57, no.4 2008, vol.57, no.5 2008, vol.57, no.6 2008, vol.57, no.7 2008, vol.57, no.8 2008, vol.57, no.9

题名作者出版年年卷期
Scanning Near-Field Millimeter-Wave Microscope: Application to a Vector-Coding TechniqueO. Benzaim; K. Haddadi; M. M. Wang; M. Maazi; D. Glay; T. Lasri20082008, vol.57, no.11
Near-Field Electromagnetic Characterization and Perturbation of Logic CircuitsTristan Dubois; Sylvie Jarrix; Annick Penarier; Philippe Nouvel; Daniel Gasquet; Laurent Chusseau; Bruno Azais20082008, vol.57, no.11
Dual Experimental Approach for Thermal Impacts on Electromagnetic Behavior of Electronic Circuit Board ConfigurationsJean-Marc Dienot; Emmanuel Batista; Michel Bernard20082008, vol.57, no.11
UWB Short-Range Bifocusing Tomographic ImagingLluis Jofre; Anna Papio Toda; Josep Miquel Jornet Montana; Patricia Ceballos Carrascosa; Jordi Romeu; Sebastian Blanch; Angel Cardama20082008, vol.57, no.11
Chilean Wine Classification Using Volatile Organic Compounds Data Obtained With a Fast GC AnalyzerNicolas H. Beltran; Manuel A. Duarte-Mermoud; Victor A. Soto Vicencio; Sebastian A. Salah; Matias A. Bustos20082008, vol.57, no.11
A Preliminary Magnetoinductive Sensor System for Real-Time Imaging of Steel Reinforcing Bars Embedded Within ConcreteDiego S. Benitez; Sung Quek; Patrick Gaydecki; Vladimir Torres20082008, vol.57, no.11
The Performance Evaluation of IEC Flicker Meters in Realistic ConditionsGiovanni Bucci; Edoardo Fiorucci; Fabrizio Ciancetta20082008, vol.57, no.11
A Flexible GPS-Based System for Synchronized Phasor Measurement in Electric Distribution NetworksAndrea Carta; Nicola Locci; Carlo Muscas; Sara Sulis20082008, vol.57, no.11
Multimode Air-Coupled Excitation of Micromechanical StructuresCetin Cetinkaya; Liang Ban; Ganesh Subramanian; Ilgaz Akseli20082008, vol.57, no.11
Novel Noise Parameter Determination for On-Wafer Microwave Noise MeasurementsChih-Hung Chen; Ying-Lien Wang; Mohamed H. Bakr; Zheng Zeng20082008, vol.57, no.11
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