长垣产业园区科技文献服务平台

期刊


ISSN0018-9456
刊名IEEE Transactions on Instrumentation and Measurement
参考译名IEEE测试设备与测量汇刊
收藏年代1998～2013

关联期刊参考译名收藏年代
IEEE Transactions on Instrumentation and MeasurementIEEE测试设备与测量汇刊 


全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013

2008, vol.57, no.1 2008, vol.57, no.10 2008, vol.57, no.11 2008, vol.57, no.12 2008, vol.57, no.2 2008, vol.57, no.3
2008, vol.57, no.4 2008, vol.57, no.5 2008, vol.57, no.6 2008, vol.57, no.7 2008, vol.57, no.8 2008, vol.57, no.9

题名作者出版年年卷期
Design of a Novel Envelope Detector for Fast-Settling CircuitsJ. P. Alegre; Belen Calvo20082008, vol.57, no.1
A Low-Cost Experimental Setup to Characterize Piezoelectric Cantilever BimorphsBruno Ando; Pietro Giannone; Salvatore Graziani20082008, vol.57, no.1
Measurements, Analysis, and Interpretation of the Signals From a High-Pressure Waterjet PumpMassimiliano Annoni; Loredana Cristaldi; Massimo Lazzaroni20082008, vol.57, no.1
On the Suitability of GRID Service Technology for Distributed Measurements Based on Complex Digital Signal Processing AlgorithmsLeopoldo Angrisani; Luigi Battaglia; Aniello Napolitano; Rosario Schiano Lo Moriello20082008, vol.57, no.1
PCB Fluxgate Magnetometers With a Residence Times Difference Readout Strategy: The Effects of NoiseBruno Ando; Salvatore Baglio; Vincenzo Sacco; Adi R. Bulsara20082008, vol.57, no.1
Design, Modeling, and Verification of High-Performance AC-DC Current Shunts From Inexpensive ComponentsKare Lind; Tore Sorsdal; Harald Slinde20082008, vol.57, no.1
Study on Generalized Analysis Model for Fringe Pattern ProfilometryYingsong Hu; Jiangtao Xi; Zongkai Yang; Enbang Li; Joe F. Chicharo20082008, vol.57, no.1
Dual-Polarized Near-Field Microwave Reflectometer for Noninvasive Inspection of Carbon Fiber Reinforced Polymer-Strengthened StructuresSergey Kharkovsky; Adam C. Ryley; Vivian Stephen; Reza Zoughi20082008, vol.57, no.1
Digital Lock-In Detection for Discriminating Multiple Modulation Frequencies With High Accuracy and Computational EfficiencyJames M. Masciotti; Joseph M. Lasker; Andreas H. Hielscher20082008, vol.57, no.1
Impedance Measurement With Sine-Fitting Algorithms Implemented in a DSP Portable DeviceTomas Radii; Pedro M. Ramos; A. Cruz Serra20082008, vol.57, no.1
123



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  机械工业信息研究院 2018-2024