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期刊


ISSN0018-9456
刊名IEEE Transactions on Instrumentation and Measurement
参考译名IEEE测试设备与测量汇刊
收藏年代1998～2013

关联期刊参考译名收藏年代
IEEE Transactions on Instrumentation and MeasurementIEEE测试设备与测量汇刊 


全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013

2000, vol.49, no.1 2000, vol.49, no.2 2000, vol.49, no.3 2000, vol.49, no.4 2000, vol.49, no.5 2000, vol.49, no.6

题名作者出版年年卷期
Visual measurement of orientation error for a mobile robotSherman Y. T. Lang; Yili Fu20002000, vol.49, no.6
Stability evaluation of high-precision multifunction instruments for traceability transferCristina Cassiago; Giuseppe La Paglia; Umberto Pogliano20002000, vol.49, no.6
Some aspects of pseudo random binary array-based surface characterizationH. J. W. Spoelder; F. M. Vos; Emil M. Petriu; F. C. A. Groen20002000, vol.49, no.6
Self-balancing linear bridge circuits with resistive mirrors for resistance measurementNiksa Tadic; Desa Gobovic20002000, vol.49, no.6
Selection of test nodes for analog fault diagnosis in dictionary approachV. C. Prasad; N. Sarat Chandra Babu20002000, vol.49, no.6
Properties of the IEEE-STD-1057 four-parameter sine wave fit algorithmPeter Handel20002000, vol.49, no.6
Online frequency domain system identification based on a virtual instrumentJozsef G. Nemeth; Balazs Vargha; Istvan Kollar20002000, vol.49, no.6
New ADC with piecewise linear characteristics: case study--implementation of a smart humidityGiovanni Bucci; Marco Faccio; Carmine Landi20002000, vol.49, no.6
Measuring of slowly changing AC signals without sample-and-hold circuitPredrag Petrovic; Slavoljub Marjanovic; Milorad Stevanovic20002000, vol.49, no.6
Maximum likelihood estimator for jitter noise modelsGerd Vandersteen; Rik Pintelon20002000, vol.49, no.6
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