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期刊


ISSN0018-9456
刊名IEEE Transactions on Instrumentation and Measurement
参考译名IEEE测试设备与测量汇刊
收藏年代1998～2013

关联期刊参考译名收藏年代
IEEE Transactions on Instrumentation and MeasurementIEEE测试设备与测量汇刊 


全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013

2000, vol.49, no.1 2000, vol.49, no.2 2000, vol.49, no.3 2000, vol.49, no.4 2000, vol.49, no.5 2000, vol.49, no.6

题名作者出版年年卷期
A comparison of wavelength dependent polarization dependent loss measurements in fiber gratingsYihong Zhu; Eli Simova; Pierre Berini; Chander P. Grover20002000, vol.49, no.6
A complex nonlinear exponential autoregressive model approach to shape recognition using neural networksShen-shu Xiong; Zhao-ying Zhou20002000, vol.49, no.6
A generic automated/semiautomated digital multi-electrode instrument of field resistivity measurementsDouglas D. Werkema, Jr.; Estella Atekwana; William Sauck; Johnson A. Asumadau20002000, vol.49, no.6
A microwave frequency reference based on VCSEL-driven dark line resonances in Cs vaporJ. Kitching; S. Knappe; N. Vukicevic; L. Hollberg; R. Wynands; W. Weidmann20002000, vol.49, no.6
A new method to measure the distance between graduation lines on graduated scalesWilliam B. Penzes; Richard A. Allen; Michale W. Cresswell; Loren W. Linholm; E. Clayton Teague20002000, vol.49, no.6
A novel current mode instrumentation amplifier (CMIA) topologySeyed Javad Azhari; Hossien Fazlalipoor20002000, vol.49, no.6
A novel intelligent strategy for improving measurement precision of FOGRong Zhu; Yanhua Zhang; Qilian Bao20002000, vol.49, no.6
A tunable vacuum-gap cryogenic coaxial capacitorFrederic Overney; Blaise Jeanneret; Miha Furlan20002000, vol.49, no.6
Algorithmic specification of a specialized processor for spectrometric applicationsMohamed Ben Slima; Leszek L. Szczecinski; Daniel Massicotte; Roman Z. Morawski; Andrzej Barwicz20002000, vol.49, no.6
An adaptive window function method for power measurementJian Qiu Zhang; Seppo J. Ovaska20002000, vol.49, no.6
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