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期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002~2023



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2014 2015 2016 2017 2018 2019
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2021, vol.50, no.1 2021, vol.50, no.2 2021, vol.50, no.3 2021, vol.50, no.4 2021, vol.50, no.5 2021, vol.50, no.6
2021, vol.50, no.8

题名作者出版年年卷期
Concentration Dependences of Charge Transfer and the Kinetics of Monte Carlo Modeling of the Growth of 2D Mono- and Nanocrystals of Gallium ChalcogenidesS. M. Asadov; S. N. Mustafaeva; V. F. Lukichev; K. I. Kelbaliev20212021, vol.50, no.6
Mechanisms of Plasma Etching of Titanium, Indium, Tin, and Zinc Oxides in a Mixture of HBr + ArA. M. Efremov; S. A. Smirnov; V. B. Betelin; K.-H. Kwon20212021, vol.50, no.6
Fault Tolerant Reversible T Latch with Enhanced Testability at Nano-Scale for Application of Ripple CountersPankaj Singh; Rupali Singh20212021, vol.50, no.6
Designing FPGAs and Reconfigurable SoCs Using Methods of Program Analysis and PrototypingV. I. Enns; S. V. Gavrilov; V. M. Khvatov; V. G. Kurbatov20212021, vol.50, no.6
Set Based Theoretical Approach to the Representation of Routing Stage in the Design Flow for the Heterogeneous FPGAs and Reconfigurable SoCsV. I. Enns; M. A. Zapletina; S. V. Gavrilov20212021, vol.50, no.6
CMOS Majority Element Based on NAND Logic with Reduced Sensitivity to Single Ionizing ParticlesV. Ya. Stenin; Yu. V. Katunin20212021, vol.50, no.6
Study of Spin-Tunnel Junction Magnetization Using Coherent Rotation of the Free Layer Magnetization ModelV. V. Amelichev; D. V. Vasiliev; D. V. Kostyuk; Yu. V. Kazakov; S. I. Kasatkin; O. P. Polyakov; P. A. Polyakov; V. S. Shevtsov20212021, vol.50, no.6
Dynamics of Stress in Films of Metals on Silicon During Vacuum Heat TreatmentV. N. Dzhuplin; V. S. Klimin; Yu. V. Morozova; A. A. Rezvan; Z. E. Vakulov; O. A. Ageev20212021, vol.50, no.6
CVC Simulation of Ultrathin Soi-Cmos Nanotransistors with a Fully Enclosed GateN. V. Masalsky20212021, vol.50, no.6
Mechanical Control of the Spectrum of a Chain of Resonators and the Organization of Remote Interaction Between Quantum DotsA. V. Tsukanov; I. Yu. Kateev20212021, vol.50, no.6
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