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期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002～2023



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2017, vol.46, no.1 2017, vol.46, no.2 2017, vol.46, no.3 2017, vol.46, no.4 2017, vol.46, no.5 2017, vol.46, no.6
2017, vol.46, no.7 2017, vol.46, no.8

题名作者出版年年卷期
Stability Analysis of Monolithic Integrated Circuit of Microwave Signal Converter to the Influence of Special FactorsK. A. Kagirina; Yu. V. Fedorov; D. V. Lavrukhin; S. A. Gamkrelidze; D. L. Gnatyuk; A. V. Zuev; O. A. Ruban; D. V. Gromov20172017, vol.46, no.3
Methods of Functional-Logic Simulation of Radiation-Induced Failures of Electronic Systems Based on the Fuzzy State Machine ModelV. M. Barbashov; O. A. Kalashnikov20172017, vol.46, no.3
Simulation of Impact of the HCP on the CNT-Nanosensor by the Molecular Dynamics MethodA. V. Sogoyan; D. V. Boychenko; A. V. Demidova20172017, vol.46, no.3
Specifics of Electromagnetic Radiation Effects on Integrated CircuitsP. K. Skorobogatov; O. A. Gerasimchuk; K. A. Epifantsev; V. A. Telets20172017, vol.46, no.3
Functional Testing of Digital Signal Processors in Radiation ExperimentsV. A. Marfin; P. V. Nekrasov; O. A. Kalashnikov; A. Yu. Nikiforov20172017, vol.46, no.3
Resistive Switching in Mesoscopic Heterostructures Based on Nd_(2-x)Ce_xCuO_(4-y) Epitaxial FilmsN. A. Tulina; A. A. Ivanov; A. N. Rossolenko; I. M. Shmytko; A. M. Ionov; R. N. Mozhchil'; I. Yu. Borisenko20172017, vol.46, no.3
Study of Transient Processes in a p-i-n Photodetector Using the Nonstationary Physical-Topological ModelE. A. Ryndin; I. V. Pisarenko20172017, vol.46, no.3
Graphene Flexible Touchscreen with Integrated Analog-Digital ConverterA. I. Vlasov; D. S. Terent'ev; V. A. Shakhnov20172017, vol.46, no.3
Partitioning Very Hard Semiconductor Sapphire Wafers into Monolithic Integrated Circuits Using Laser Controlled Thermal CleavageN. V. Shchavruk; S. V. Redkin; A. A. Trofimov; N. E. Ivanova; A. S. Skripnichenko; V. S. Kondratenko; V. V. Styran20172017, vol.46, no.3
Power Switching Transistors Based on Gallium Nitride Epitaxial HeterostructuresE. V. Erofeev; I. V. Fedin; Y. N. Yurjev20172017, vol.46, no.3
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