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期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002～2023



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2015, vol.44, no.1 2015, vol.44, no.2 2015, vol.44, no.3 2015, vol.44, no.4 2015, vol.44, no.5 2015, vol.44, no.6
2015, vol.44, no.7 2015, vol.44, no.8

题名作者出版年年卷期
Modeling of the Spectroscopic Response of Photonic Isomers with NV-Centers. Part IIA. V. Tsukanov20152015, vol.44, no.6
Basic Memory Elements Using DICE Cells for Fault-Tolerant 28 nm CMOS RAMV. Ya. Stenin; P. V. Stepanov20152015, vol.44, no.6
Design-Processing Features of Microwave GaAs Monolithic Integrated Circuits of a Low-Noise Amplifier with a Copper Metallized FrontsideS. V. Ishutkin; V. A. Kagadey; E. V. Erofeev; E. V. Anishchenko; V. S. Arykov20152015, vol.44, no.6
Creation of Lithographic Masks Using a Scanning Probe MicroscopeD. A. Bizyaev; A. A. Bukharaev; S. A. Ziganshina; N. I. Nurgazizov; T. F. Khanipov; A. P. Chuklanov20152015, vol.44, no.6
Modification of the Positive Photoresist Surface by Ion ImplantationD. I. Brinkevich; S. D. Brinkevich; M. G. Lukashevich; V. S. Prosolovich; V. B. Odzhaev; Yu. N. Yankovskii20152015, vol.44, no.6
Calculation of the Schottky Barrier Height at the Contact between a Metal and (SiC)_(1-x)(AlN)_x Semiconductor Solid SolutionG. K. Safaraliev; B. A. Bilalov; M. K. Kurbanov; V. I. Altukhov; I. S. Kas'yanenko; A. V. Sankin20152015, vol.44, no.6
Atomic Mechanisms of Strain Relaxation in Heteroepitaxial Cu/Ni(001) SystemO. S. Trushin; A. N. Kupryanov; S. C. Ying; E. Granato; T. Ala-Nissila20152015, vol.44, no.6
Adaptive Equalizer with a Controller of a Minimally Admissible Differential Voltage of the Output Signal and Pseudodifferential Cascode Output Buffer for the 10-Gb/s Transmitter according to the 65-nm CMOS TechnologyA. V. Larionov20152015, vol.44, no.6
Development of Crystal Matrix of Tensoresistive Pressure Tactile Transducers for RoboticsD. V. Gusev; R. S. Litvinenko; V. S. Sukhanov20152015, vol.44, no.6
Thin-Film Capacitor Based on the Strontium Titanate Formed by the Sol Gel TechniqueKh. Sokhrabi Anaraki; N. V. Gaponenko; M. V. Rudenko; V. V. Kolos; A. N. Petlitskii; A. S. Turtsevich20152015, vol.44, no.6



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