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期刊


ISSN0957-4522
刊名Journal of Materials Science
参考译名材料科学杂志：电子材料
收藏年代1999～2013



全部

1999 2000 2001 2002 2003 2004
2005 2006 2007 2008 2009 2010
2011 2012 2013

2003, vol.14, no.1 2003, vol.14, no.10-12 2003, vol.14, no.2 2003, vol.14, no.3 2003, vol.14, no.4 2003, vol.14, no.5-6-7
2003, vol.14, no.8 2003, vol.14, no.9

题名作者出版年年卷期
The gueorgi nadjakov lecture negative-U defects in chalcogenide glasses: elusive or non-existent?G. J. ADRIAENSSENS; N. QAMHIEH20032003, vol.14, no.10-12
Computer-assisted study of carrier thermalization by hopping in disordered semiconductorsJ. M. MARSHALL20032003, vol.14, no.10-12
Spatial and energetic profiling of defects in thin' film siliconS. REYNOLDS, C. MAIN; R. BRUGGEMANN20032003, vol.14, no.10-12
Microcrystalline silicon prepared with hot-wire CVDF. Finger; S. Klein; R. Carius; T. Dylla; O. Vetterl; A. L. Baia Neto20032003, vol.14, no.10-12
A comparison of microcrystalline silicon prepared by plasma-enhanced chemical vapor deposition and hot-wire chemical vapor deposition: electronic and device propertiesR. Carius; T. Merdzhanova; F. Finger; S. Klein; O. Vetterl20032003, vol.14, no.10-12
Photoconductivity studies of n-type hydrogenated amorphous silicon and microcrystalline siliconR. BRUGGEMANN20032003, vol.14, no.10-12
Recombination echoes in disordered siliconK. LIPS; C. BOEHME20032003, vol.14, no.10-12
The impact of the structural dimensions and optical properties of bulk material on the optical performance of diffraction microstructures: crystalline silicon gratings and applicationsS. HAVA20032003, vol.14, no.10-12
Advanced patterning techniques for nanodevice fabricationI. Kostic; R. Andok; V. Barak; I. Caplovic; A. Konecnikova; L Matay; P. Hrkut; A. Ritomsky20032003, vol.14, no.10-12
Thick LPE layers of InAs{sub}(1-x) for 3-5μm optoelectronic applicationsA. S. Popov; S. L. Tzeneva; A. M. Koinova; K. S. Varblianska20032003, vol.14, no.10-12
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