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期刊


ISSN0957-4522
刊名Journal of Materials Science
参考译名材料科学杂志：电子材料
收藏年代1999～2013



全部

1999 2000 2001 2002 2003 2004
2005 2006 2007 2008 2009 2010
2011 2012 2013

1999, vol.10, no.1 1999, vol.10, no.2 1999, vol.10, no.3 1999, vol.10, no.4 1999, vol.10, no.5-6 1999, vol.10, no.7
1999, vol.10, no.8 1999, vol.10, no.9

题名作者出版年年卷期
Absolute lattice parameter measurementP. F. Fewster19991999, vol.10, no.3
Characterization of strain relaxation of (0 0 1) oriented SrTiO{sub}3 thin films grown on LaAlO{sub}3 (1 1 0) by means of reciprocal space mapping using x-ray diffractionC. N. L. Edvardsson; J. Birch; U. Helmersson19991999, vol.10, no.3
Diffuse x-ray reflection from multilayers with rough interfacesV. Holy19991999, vol.10, no.3
Grazing incidence reciprocal space mapping of partially relaxed SiGe filmsP. M. Mooney19991999, vol.10, no.3
Plane-wave X-ray topography and its application to semiconductor problemsR. Kohler19991999, vol.10, no.3
Reciprocal-space analysis of compositional modulation in short-period superlattices using position-sensitive x-ray detectionS. R. Lee; J. Mirecki Millunchick; R. D. Twesten; D. M. Follstaedt; J. L. Reno; S. P. Ahrenkiel; A. G. Norman19991999, vol.10, no.3
Study of the lattice strain relaxation in the Ga{sub}(1-x)Al{sub}xSb/GaSb system by x-ray topography and high resolution diffractionC. Bocchi; F. Germini; S. Franchi; A. Baraldi; S. Gennari; R. Magnanini; A. V. Drigo19991999, vol.10, no.3
X-ray diffraction from quantum wires and quantum dotsY. Zhuang; J. Stangl; A. A. Darhuber; G. Bauer; P. Mikulik; V. Holy; N. Darowski; U. Pietsch19991999, vol.10, no.3
X-ray diffraction reciprocal space pole figure characterization of cubic GaN epitaxial layers grown on (0 0 1) GaAs by molecular beam epitaxyZhixin Qin; Masakazu Kobayashi; Akihiko Yoshikawa19991999, vol.10, no.3



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