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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

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2007, vol.23, no.1 2007, vol.23, no.2-3 2007, vol.23, no.4 2007, vol.23, no.5 2007, vol.23, no.6

题名作者出版年年卷期
A System-layer Infrastructure for SoC DiagnosisP. Bernardi; M. Grosso; M. Rebaudengo; M. Sonza Reorda20072007, vol.23, no.5
Securing Scan Control in Crypto ChipsDavid Hely; Frederic Bancel; Marie-Lise Flottes; Bruno Rouzeyre20072007, vol.23, no.5
Too Few or Too Many Properties? Measure it by ATPG!Franco Fummi; Graziano Pravadelli20072007, vol.23, no.5
Functional Constraints vs. Test Compression in Scan-Based Delay TestingIlia Polian; Hideo Fujiwara20072007, vol.23, no.5
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge CircuitsLuigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel; Magali Bastian20072007, vol.23, no.5
Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable HardwareFatih Kocan; Daniel G. Saab20072007, vol.23, no.5
A Novel EDA Tool for VLSI Test Vectors ManagementWalid Ibrahim20072007, vol.23, no.5



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