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期刊
ISSN
0923-8174
刊名
Journal of Electronic Testing
参考译名
电子测试杂志:理论与应用
收藏年代
2000~2024
全部
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题名
作者
出版年
年卷期
Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop Application
Pattanaik, Manisha; Srivastava, Pankaj; Ahirwar, Rachana
2024
2024, vol.40, no.2
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal Transmission
Cao, Rongxing; Liu, Yan; Cai, Yulong; Mei, Bo; Zhao, Lin; Tian, Jiayu; Cui, Shuai; Lv, He; Zeng, Xianghua; Xue, Yuxiong
2024
2024, vol.40, no.2
The Editorial
Agrawal, Vishwani D.
2024
2024, vol.40, no.2
A DfT Strategy for Guaranteeing ReRAM's Quality after Manufacturing
Copetti, T. S.; Fieback, M.; Gemmeke, T.; Poehls, L. M. Bolzani; Hamdioui, S.
2024
2024, vol.40, no.2
A Survey and Recent Advances: Machine Intelligence in Electronic Testing
Roy, Soham; Millican, Spencer K.; Agrawal, Vishwani D.
2024
2024, vol.40, no.2
Instant Test and Repair for TSVs using Differential Signaling
Wen, Ching-Yi; Huang, Shi-Yu
2024
2024, vol.40, no.2
An Analytical Model for Deposited Charge of Single Event Transient (SET) in FinFET
Liu, Baojun; Cai, Li; Li, Chuang
2024
2024, vol.40, no.2
Syntactic and Semantic Analysis of Temporal Assertions to Support the Approximation of RTL Designs
Bosio, Alberto; Germiniani, Samuele; Pravadelli, Graziano; Traiola, Marcello
2024
2024, vol.40, no.2
Simulation-based Analysis of RPL Routing Attacks and Their Impact on IoT Network Performance
Bokka, Raveendranadh; Sadasivam, Tamilselvan
2024
2024, vol.40, no.2
Sahand: A Software Fault-Prediction Method Using Autoencoder Neural Network and K-Means Algorithm
Arasteh, Bahman; Golshan, Sahar; Shami, Shiva; Kiani, Farzad
2024
2024, vol.40, no.2
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