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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2007, vol.23, no.1 2007, vol.23, no.2-3 2007, vol.23, no.4 2007, vol.23, no.5 2007, vol.23, no.6

题名作者出版年年卷期
Functionally Fault-tolerant DSP Microprocessor using Sigma-delta Modulated SignalsERIK SCHULER; MARCELO IENCZCZAK ERIGSON; LUIGI CARRO20072007, vol.23, no.4
Techniques for Disturb Fault CollapsingMOHAMMAD GH. MOHAMMAD; LAILA TERKAWI20072007, vol.23, no.4
MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCsSUNGHOON CHUN; YONGJOON KIM; SUNGHO KANG20072007, vol.23, no.4
A Formal Analysis of Fault Diagnosis with D-matricesJ. W. SHEPPARD; S. G. W. BUTCHER20072007, vol.23, no.4
Ensembles of Neural Networks for Fault Diagnosis in Analog CircuitsM. A. EL-GAMAL; M. D. A. MOHAMED20072007, vol.23, no.4
IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk DetectionKATHERINE SHU-MIN LI; CHUNG-LEN LEE; CHAUCHIN SU; JWU E. CHEN20072007, vol.23, no.4
The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based ApproachJ. M. GILBERT; I. M. BELL20072007, vol.23, no.4



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