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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2004, vol.20, no.1 2004, vol.20, no.2 2004, vol.20, no.3 2004, vol.20, no.4 2004, vol.20, no.5 2004, vol.20, no.6

题名作者出版年年卷期
Datapath BIST Insertion Using Pre-Characterized Area and Testability DataJ. C. WANG; P. S. CARDOSO; J. A. Q. GONZALEZ; M. STRUM; R. PIRES20042004, vol.20, no.4
On High-Quality, Low Energy Built-in Self Test Preparation at RT-LevelM. B. SANTOS; I. C. TEIXEIRA; J. P. TEIXEIRA; S. MANICH; L. BALADO; J. FIGUERAS20042004, vol.20, no.4
Searching for Global Test Costs Optimization in Core-Based SystemsERIKA COTA; LUIGI CARRO; MARCELO LUBASZEWSKI; ALEX ORAILOGLU20042004, vol.20, no.4
Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test ProcedureF. AZAIS; S. BERNARD; Y. BERTRAND; M. COMTE; M. RENOVELL20042004, vol.20, no.4
Oscillation Test Strategy: A Case StudyEDUARDO ROMERO; GABRIELA PERETTI; CARLOS MARQUES20042004, vol.20, no.4
Merging a DSP-Oriented Signal Integrity Technique and SW-Based Fault Handling Mechanisms to Ensure Reliable DSP SystemsFABIAN VARGAS; RUBEM D. FAGUNDES; DANIEL BARROS, JR.; DIOGO B. BRUM; EDUARDO RHOD20042004, vol.20, no.4
Simulating Single Event Transients in VDSM ICs for GroundDAN ALEXANDRESCU; LORENA ANGHEL; MICHAEL NICOLAIDIS20042004, vol.20, no.4
A New FPGA for DSP Applications Integrating BIST CapabilitiesALEX GONSALES; MICHEL RENOVELL; MARCELO LUBASZEWSKI; LUIGI CARRO20042004, vol.20, no.4
A New Approach to Software-Implemented Fault ToleranceM. REBAUDENGO; M. SONZA REORDA; M. VIOLANTE20042004, vol.20, no.4
Mutation Analysis and Constraint-Based Criteria: Results from an Empirical Evaluation in the Context of Software TestingINALI WISNIEWSKI SOARES; SILVIA REGINA VERGILIO20042004, vol.20, no.4
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