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期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



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2004, vol.20, no.1 2004, vol.20, no.2 2004, vol.20, no.3 2004, vol.20, no.4 2004, vol.20, no.5 2004, vol.20, no.6

题名作者出版年年卷期
A Design for Testability Scheme for CMOS LC-Tank Voltage Controlled OscillatorsL. DERMENTZOGLOU; Y. TSIATOUHAS; A. ARAPOYANNI20042004, vol.20, no.2
Analog Switches in Programmable Analog Devices: Quiescent Defective BehavioursR. RODRIGUEZ-MONTANES; D. MUNOZ; L. BALADO; J. FIGUERAS20042004, vol.20, no.2
A Low-Cost At-Speed BIST Architecture for Embedded Processor and SRAM CoresM. H. TEHRANIPOUR; S. M. FAKHRAIE; Z. NAVABI; M. R. MOVAHEDIN VLSI20042004, vol.20, no.2
Testability Trade-Offs for BIST Data PathsNICOLA NICOLICI; BASHIR M. AL-HASHIMI; A. P. Ambler20042004, vol.20, no.2
Scalable Delay Fault BIST for Use with Low-Cost ATEILIA POLIAN; BERND BECKER20042004, vol.20, no.2
Analysis of Test Application Time for Test Data Compression Methods Based on Compression CodesANSHUMAN CHANDRA; KRISHNENDU CHAKRABARTY20042004, vol.20, no.2



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