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期刊


ISSN0957-0233
刊名Measurement Science & Technology
参考译名测量科学与技术
收藏年代1990～2013



全部

1990 1991 1992 1993 1999 2000
2001 2002 2003 2004 2005 2006
2007 2008 2009 2010 2011 2012
2013

2012, vol.23, no.1 2012, vol.23, no.10 2012, vol.23, no.11 2012, vol.23, no.12 2012, vol.23, no.2 2012, vol.23, no.3
2012, vol.23, no.4 2012, vol.23, no.5 2012, vol.23, no.6 2012, vol.23, no.7 2012, vol.23, no.9

题名作者出版年年卷期
Recent developments and challenges of nanopositioning and nanomeasuring technologyEberhard Manske; Gerd Jager; Tino Hausotte; Roland Fussl20122012, vol.23, no.7
Advances in engineering nanometrology at the National Physical LaboratoryRichard K. Leach; James Claverley; Claudiu Giusca; Christopher W. Jones; Lakshmi Nimishakavi; Wenjuan Sun; Matthew Tedaldi; Andrew Yacoot20122012, vol.23, no.7
Sub-atomic dimensional metrology: developments in the control of x-ray interferometersAndrew Yacoot; Ulrich Kuetgens20122012, vol.23, no.7
Interference signal demodulation for nanopositioning and nanomeasuring machinesT. Hausotte; B. Percle; U. Gerhardt; D. Dontsov; E. Manske; G. Jager20122012, vol.23, no.7
Phase measurement of various commercial heterodyne He-Ne-laser interferometers with stability in the picometer regimeP. Kochert; J. Flugge; Ch Weichert; R. Koning; E. Manske20122012, vol.23, no.7
Heterodyne interferometer laser source with a pair of two phase locked loop coupled He-Ne lasers by 632.8 nmC. Sternkopf; C. Diethold; U. Gerhardt; J. Wurmus; E. Manske20122012, vol.23, no.7
Enhanced measurement of steep surfaces by slope-adapted sensor tiltingAlbert Weckenmann; Alexander Schuler; Romuald J. B. Ngassam20122012, vol.23, no.7
Fibre-coupled monochromatic zero-point sensor for precision positioning systems using laser interferometersFelix G. Balzer; Uwe Gerhardt; Tino Hausotte; Eberhard Manske; Gerd Jager20122012, vol.23, no.7
A novel approach to correction of optical aberrations in laser scanning microscopy for surface metrologyL. S. Ginani; R. Theska20122012, vol.23, no.7
Area-based optical 2.5D sensors of a nanopositioning and nanomeasuring machineT. Machleidt; E. Sparrer; E. Manske; D. Kapusi; K. H. Franke20122012, vol.23, no.7
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