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期刊
ISSN
0957-0233
刊名
Measurement Science & Technology
参考译名
测量科学与技术
收藏年代
1990~2013
全部
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2012, vol.23, no.1
2012, vol.23, no.10
2012, vol.23, no.11
2012, vol.23, no.12
2012, vol.23, no.2
2012, vol.23, no.3
2012, vol.23, no.4
2012, vol.23, no.5
2012, vol.23, no.6
2012, vol.23, no.7
2012, vol.23, no.9
题名
作者
出版年
年卷期
Calibration of a microprobe array
Christian Schrader; Rainer Tutsch
2012
2012, vol.23, no.5
A new micro/nano displacement measurement method based on a double-fiber Bragg grating (FBG) sensing structure
Fangfang Liu; Yetai Fei; Haojie Xia; Lijuan Chen
2012
2012, vol.23, no.5
A new method for high-accuracy gauge block measurement using 2 GHz repetition mode of a mode-locked fiber laser
Narin Chanthawong; Satoru Takahashi; Kiyoshi Takamasu; Hirokazu Matsumoto
2012
2012, vol.23, no.5
Analysis of technical requirements and the self-modification method for a combinatorial code grating eddy-current absolute-position sensor
Weiwen Liu; Hui Zhao; Wei Tao; Chunfeng Lv; Hongli Qi
2012
2012, vol.23, no.5
A task specific uncertainty analysis method for least-squares-based form characterization of ultra-precision freeform surfaces
M. J. Ren; C. F. Cheung; L. B. Kong
2012
2012, vol.23, no.5
A comparison of sensitivity standards in form metrology - final results of the EURAMET project 649
Otto Jusko; Harald Bosse; David Flack; Bjorn Hemming; Marco Pisani; Ruedi Thalmann
2012
2012, vol.23, no.5
Influence of standing wave phase error on super-resolution optical inspection for periodic microstructures
R. Kudo; S. Usuki; S. Takahashi; K. Takamasu
2012
2012, vol.23, no.5
Picometre and nanoradian heterodyne interferometry and its application in dilatometry and surface metrology
T. Schuldt; M. Gohlke; H. Kogel; R. Spannagel; A. Peters; U. Johann; D. Weise; C. Braxmaier
2012
2012, vol.23, no.5
Advantages of chromatic-confocal spectral interferometry in comparison to chromatic confocal microscopy
W. Lyda; M. Gronle; D. Fleischle; F. Mauch; W. Osten
2012
2012, vol.23, no.5
Development of ballistics identification-from image comparison to topography measurement in surface metrology
J Song; W. Chu; T. V. Vorburger; R. Thompson; T. B. Renegar; A. Zheng; J. Yen; R. Silver; M. Ols
2012
2012, vol.23, no.5
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