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期刊


ISSN0958-1952
刊名Microscopy and Analysis
参考译名显微镜学与分析——英国版
收藏年代2008～2012



全部

2008 2009 2010 2011 2012

2009 2009, no. tn129 2009, no. tn130

题名作者出版年年卷期
What's New in Atomic Force Microscopy of Polymers? An UpdateJulius Vancso; Peter Schon; Joost Duvigneau20092009
Histomorphology and X-Ray Microanalysis of Reparative Dentin in Primary TeethA. Robertson; S. Nietzsche20092009
Improved DQE for TEM Imaging Plates by Correction of Geometric DistortionPetra Bele20092009
Applications of Helium Ion Microscopy in Semiconductor ManufacturingRainer Reiche; Rainer Kaesmaier; Rudiger Rosenkranz; Uwe Ritter; Steffen Teichert; Susann Leinert20092009
Thickness Effects in Tilted Sample Annular Darkfield Scanning Transmission EMAndrea Parisini; Vittorio Morandi; Salvatore Mezzotero20092009
Importance of Compound Standards for EPMA of Garnet Laser MaterialsDirk Maier; Dieter Rhede; Rainer Bertram; Detlef Klimm20092009
Variable Pressure and Environmental SEM of Thin-Film Liquid Crystal/Polymer CompositesKashma K. Rai; Sameet K. Shriyan; Adam K. Fontecchio20092009
Scanning Electron Microscopical Analysis of Incandescent Lamp Tungsten FilamentsSyed Nasimul Alam20092009
Light Microscopy and SEM of Bacteria in Dentin in Traumatized Primary TeethAgneta Robertson; Sandor Nietzsche20092009
NADIS: A Novel AFM-based Tool for Dispensing Fluids into Single CellsHarry Heinzelmann; Andre Meister; Philippe Niedermann; Joanna Bitterli; Jerome Polesel-Maris; Martha Liley; Michael Gabi; Pascal Behr; Philipp Studer; Janos Voros; Tomaso Zambelli20092009
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