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期刊
ISSN
2043-0655
刊名
Microscopy and Analysis
参考译名
显微镜学与分析——欧洲版
收藏年代
2008~2012
全部
2008
2009
2010
2011
2012
2010
2010, vol.2010 SUPPL..
题名
作者
出版年
年卷期
Analysis of Spectrum-Imaging Datasets in Atomic-Resolution Electron Microscopy
Masashi Watanabe; Eiji Okunishi; Kazuo Ishizuka
2010
2010
Transmission Microscopy without Lenses: Principles, Benefits and Applications
John Rodenburg; Andrew Maiden
2010
2010
LM and SEM Metallographical Study of Gear Teeth in Bucket-Wheel Excavators
Athanasios Vazdirvanidis; George Pantazopoulos; Konstantinos Stamatakis
2010
2010
Spinning Disk Confocal Microscopy of Calcium Signalling in Blood Vessel Walls
Mark Nelson; Jonathan Ledoux; Mark Taylor; Adrian Bonev; Rachael Hannah; Viktoriya Solodushko; Bo Shui; Yvonne Tallini; Michael Kotlikoff
2010
2010
Analytical TEM of Materials using a Large Area Silicon Drift EDS Detector
Ming Q. Chu
2010
2010
Three-Dimensional Reconstruction of the Cornea by Electron Tomography
Geraint J. Parfitt; Christian Pinali; Philip N. Lewis; Robert D. Young; Andrew J. Quantock; Carlo Knupp
2010
2010
Nanoscale Infrared Spectroscopy of Materials by Atomic Force Microscopy
Craig Prater; Kevin Kjoller; Debra Cook; Roshan Shetty; Gregory Meyers; Carl Reinhardt; Jonathan Felts; William King; Konstantin Vodopyanov; Alexandre Dazzi
2010
2010
Unravelling the Local Electronic Properties in Complex Nanoscale Systems with CI-AFM
Peter N. Nirmalraj; Jonathan N. Coleman; John J. Boland
2010
2010
Combined AFM and Optical Techniques: From Biology to Solar
Ray J. Boucher
2010
2010
Scanning Surface Potential and Navigated Atomic Force Microscopy of Pigments
Ray J. Boucher
2010
2010
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