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期刊


ISSN1751-8601
刊名IET Computers & Digital Techniques
参考译名IET计算机与数字技术
收藏年代2007～2012

关联期刊参考译名收藏年代
IEE Proceedings英国电气工程师学会论文集：计算机与数字技术1999～2006


全部

2007 2008 2009 2010 2011 2012

2012, vol.6, no.1 2012, vol.6, no.2 2012, vol.6, no.3 2012, vol.6, no.4 2012, vol.6, no.5 2012, vol.6, no.6

题名作者出版年年卷期
Arithmetic module-based built-in self test architecture for two-pattern testingI. Voyiatzis; C. Efstathiou; H. Antonopoulou; A. Milidonis20122012, vol.6, no.4
Multi-objective optimisations for a superscalar architecture with selective value predictionA. Gellert; H. Calborean; L. Vintan; A. Florea20122012, vol.6, no.4
Efficient post-configuration testing of an asynchronous nanowire crossbar system for reliabilityJ. S. Lee; S. Venkateswaran; M. Choi20122012, vol.6, no.4
Functional broadside tests for embedded logic blocksI. Pomeranz20122012, vol.6, no.4
Reset and partial-reset-based functional broadside testsI. Pomeranz; S. M. Reddy20122012, vol.6, no.4
Design of experiments and integer linear programming-assisted conjugate-gradient optimisation of high-kappa/metal-gate nano-complementary metal-oxide semiconductor static random access memoryS. P. Mohanty; E. Kougianos20122012, vol.6, no.4
FPGA accelerator for floating-point matrix multiplicationZ. Jovanovic; V. Milutinovic20122012, vol.6, no.4
Arithmetic module-based built-in self test architecture for two-pattern testingI. Voyiatzis; C. Efstathiou; H. Antonopoulou; A. Milidonis20122012, vol.6, no.4
Multi-objective optimisations for a superscalar architecture with selective value predictionA. Gellert; H. Calborean; L. Vintan; A. Florea20122012, vol.6, no.4
Efficient post-configuration testing of an asynchronous nanowire crossbar system for reliabilityJ. S. Lee; S. Venkateswaran; M. Choi20122012, vol.6, no.4
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