长垣产业园区科技文献服务平台

期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2019, vol.35, no.1 2019, vol.35, no.2 2019, vol.35, no.3 2019, vol.35, no.4 2019, vol.35, no.5 2019, vol.35, no.6

题名作者出版年年卷期
Fault Localization and Testability Approaches for FPGA Fabric Aware Canonic Signed Digit Recoding ImplementationsPalchaudhuri, Ayan; Dhar, Anindya Sundar20192019, vol.35, no.6
DVFS Based Error Avoidance Strategy in Wireless Network-on-ChipOuyang, Yiming; Wang, Qi; Hu, Lizhu; Liang, Huaguo20192019, vol.35, no.6
Leveraging Balanced Logic Gates as Strong PUFs for Securing IoT Against Malicious AttacksYu, Weize; Wen, Yiming20192019, vol.35, no.6
Noise and Spur Comparison of Delta-Sigma Modulators in Fractional-N PLLsZhou, Bo; Li, Yao; Zhao, Fuyuan20192019, vol.35, no.6
Multi-PVT-Point Analysis and Comparison of Recent Small-Delay Defect Quality MetricsSavaria, Yvon; Thibeault, Claude; Hasib, Omar Al-Terkawi20192019, vol.35, no.6
Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D StackSun, Yi; Zhang, Fanchen; Jiang, Hui; Nepal, Kundan; Dworak, Jennifer; Manikas, Theodore; Bahar, R. Iris20192019, vol.35, no.6
Multi-Step-Ahead Prediction for a CMOS Low Noise Amplifier Aging Due to NBTI and HCI Using Neural NetworksYang, Chuang; Feng, Feng20192019, vol.35, no.6
Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal AcquisitionMoon, Thomas; Choi, Hyun Woo; Keezer, David C.; Chatterjee, Abhijit20192019, vol.35, no.6
Comparing Graph-Based Algorithms to Generate Test Cases from Finite State MachinesMariano, Matheus Monteiro; de Souza, Erica Ferreira; Endo, Andre Takeshi; Vijaykumar, Nandamudi Lankalapalli20192019, vol.35, no.6
An Efficient Technique to Detect Stealthy Hardware Trojans Independent of the Trigger SizeSebt, S. M.; Patooghy, A.; Beitollahi, H.20192019, vol.35, no.6
12



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  机械工业信息研究院 2018-2024