长垣产业园区科技文献服务平台

期刊


ISSN0923-8174
刊名Journal of Electronic Testing
参考译名电子测试杂志：理论与应用
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2008, vol.24, no.1-3 2008, vol.24, no.4 2008, vol.24, no.5 2008, vol.24, no.6

题名作者出版年年卷期
Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current SensorsEgas Henes Neto; Gilson Wirth; Fernanda Lima Kastensmidt20082008, vol.24, no.5
Improving the Effectiveness of Combinational Decompressors Through Judicious Partitioning of Scan CellsOzgur Sinanoglu20082008, vol.24, no.5
Comparison of NIST and Wavelet Transform Test Point Selection Methods For a Programmable Gain AmplifierXinsong Zhang; Simon S. Ang; Chandra Carter20082008, vol.24, no.5
Noise-Insensitive Digital BIST for any PLL or DLLStephen Sunter; Aubin Roy20082008, vol.24, no.5
Reverse Breakdown Voltage Measurement for Power P{sup}+NN{sup}+ RectifierGuangyu Huang; Cher Ming Tan20082008, vol.24, no.5
Controllability of Static CMOS Circuits for Timing CharacterizationRamyanshu Datta; Ravi Gupta; Antony Sebastine; Jacob A. Abraham; Manuel d'Abreu20082008, vol.24, no.5
A Reconfigurable Power Conscious Core Wrapper and its Application to System-on-Chip Test SchedulingErik Larsson; Zebo Peng20082008, vol.24, no.5



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  机械工业信息研究院 2018-2024