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期刊


ISSN0018-9456
刊名IEEE Transactions on Instrumentation and Measurement
参考译名IEEE测试设备与测量汇刊
收藏年代1998～2013

关联期刊参考译名收藏年代
IEEE Transactions on Instrumentation and MeasurementIEEE测试设备与测量汇刊 


全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013

2010, vol.59, no.1 2010, vol.59, no.10 2010, vol.59, no.11 2010, vol.59, no.12 2010, vol.59, no.2 2010, vol.59, no.3
2010, vol.59, no.4 2010, vol.59, no.5 2010, vol.59, no.6 2010, vol.59, no.7 2010, vol.59, no.8 2010, vol.59, no.9

题名作者出版年年卷期
Metrological Characterization of a CADx System for the Classification of Breast Masses in MammogramsArianna Mencattini; Marcello Salmeri; Giulia Rabottino; Simona Salicone20102010, vol.59, no.11
Statistical Properties of Voltage Dip DetectorsGianluca Guerrieri; Antonio Moschitta; Paolo Carbone; Carlo Muscas20102010, vol.59, no.11
Accuracy of Sine Wave Frequency Estimation by Multipoint Interpolated DFT ApproachDaniel Belega; Dominique Dallet; Dario Petri20102010, vol.59, no.11
Uncertainty Evaluation in Two-Dimensional Indirect Measurement by Evidence and Probability TheoriesMarco Pertile; Mariolino De Cecco; Luca Baglivo20102010, vol.59, no.11
Uncertainty Evaluation Under Dynamic Conditions Using Polynomial Chaos TheoryAntonello Monti; Ferdinanda Ponci20102010, vol.59, no.11
A Unified Framework for Uncertainty, Compatibility Analysis, and Data Fusion for Multi-Stereo 3-D Shape EstimationMariolino De Cecco; Marco Pertile; Luca Baglivo; Massimo Lunardelli; Francesco Setti; Mattia Tavernini20102010, vol.59, no.11
A Combined Approach for High-Resolution Corrosion Monitoring and Temperature Compensation Using UltrasoundTarjei Rommetveit; Tonni F. Johansen; Roy Johnsen20102010, vol.59, no.11
Modeling DAC Output WaveformsMassimo D'Apuzzo; Mauro D'Arco; Annalisa Liccardo; Michele Vadursi20102010, vol.59, no.11
Initial Position Estimation Using RFID Tags: A Least-Squares ApproachAngus F. C. Errington; Brian L. F. Daku; Arnfinn F. Prugger20102010, vol.59, no.11
On-Chip Stimulus Generator for Gain, Linearity, and Blocking Profile Test of Wideband RF Front EndsRashad Ramzan; Naveed Ahsan; Jerzy Dabrowski20102010, vol.59, no.11
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