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期刊


ISSN0018-9456
刊名IEEE Transactions on Instrumentation and Measurement
参考译名IEEE测试设备与测量汇刊
收藏年代1998～2013

关联期刊参考译名收藏年代
IEEE Transactions on Instrumentation and MeasurementIEEE测试设备与测量汇刊 


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1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013

2005, vol.54, no.1 2005, vol.54, no.2 2005, vol.54, no.3 2005, vol.54, no.4 2005, vol.54, no.5 2005, vol.54, no.6

题名作者出版年年卷期
Revisiting Response Compaction in Space for Full-Scan Circuits With Nonexhaustive Test Sets Using Concept of Sequence CharacterizationSunil R. Das; Chittoor V. Ramamoorthy; Mansour H. Assaf; Emil M. Petriu; Wen-Ben Jone; Mehmet Sahinoglu20052005, vol.54, no.5
Architecture and Design of an Open ATE to Incubate the Development of Third-Party InstrumentsRochit Rajsuman; Noriyuki Masuda; Kazuhiro Yamashita20052005, vol.54, no.5
CAD Navigation and Diagnostics by Linking ATE and EDAKatsuhito Nagano20052005, vol.54, no.5
A Translinear RMS Detector for Embedded Test Of RF ICsQizhang Yin; William R. Eisenstadt; Robert M. Fox; Tao Zhang20052005, vol.54, no.5
Embedded Loopback Test for RF ICsJang-Sup Yoon; William R. Eisenstadt20052005, vol.54, no.5
A Built-in Self-Testing Method for Embedded Multiport Memory ArraysV. Narayanan; Swaroop Ghosh; Wen-Ben Jone; Sunil R. Das20052005, vol.54, no.5
A Dual-Mode Built-in Self-Test Technique for Capacitive MEMS DevicesXingguo Xiong; Yu-Liang (David) Wu; Wen-Ben Jone20052005, vol.54, no.5
A Methodology to Perform Online Self-Testing for Field-Programmable Analog Array CircuitsAmit Laknaur; Haibo Wang20052005, vol.54, no.5
Evaluation, Analysis, and Enhancement of Error Resilience for Reliable Compression of VLSI Test DataHamidreza Hashempour; Luca Schiano; Fabrizio Lombardi20052005, vol.54, no.5
Analysis and Evaluation of Multisite Testing for VLSIHamidreza Hashempour; Fred J. Meyer; Fabrizio Lombardi20052005, vol.54, no.5
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