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期刊


ISSN0018-9456
刊名IEEE Transactions on Instrumentation and Measurement
参考译名IEEE测试设备与测量汇刊
收藏年代1998～2013

关联期刊参考译名收藏年代
IEEE Transactions on Instrumentation and MeasurementIEEE测试设备与测量汇刊 


全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013

2003, vol.52, no.1 2003, vol.52, no.2 2003, vol.52, no.3 2003, vol.52, no.4 2003, vol.52, no.5 2003, vol.52, no.6

题名作者出版年年卷期
Space Compaction of Test Responses Using Orthogonal Transmission FunctionsKrishnendu Chakrabarty; Markus Seuring20032003, vol.52, no.5
Parity Bit Signature in Response Data Compaction and Built-in Self-Testing of VLSI Circuits With Nonexhaustive Test SetsSunil R. Das; Made Sudarma; Mansour H. Assaf; Emil M. Petriu; Wen-Ben Jone; Krishnendu Chakrabarty; Mehmet Sahinoglu20032003, vol.52, no.5
An Efficient BIST Method for Non-Traditional Faults of Embedded Memory ArraysWen-Ben Jone; Der-Chen Huang; Sunil R. Das20032003, vol.52, no.5
Self-Checking Logic Design for FPGA ImplementationParag K. Lala; Alfred L. Burress20032003, vol.52, no.5
A Self-Binning BIST Structure for Data Communications TransceiversSan L. Lin; Shoba Krishnan; Samiha Mourad20032003, vol.52, no.5
Architecture, Design, and Application of an Event-Based Test SystemRochit Rajsuman20032003, vol.52, no.5
An Empirical Bayesian Stopping Rule in Testing and Verification of Behavioral ModelsMehmet Sahinoglu20032003, vol.52, no.5
Test Limitations of Parametric Faults in Analog CircuitsJacob Savir; Zhen Guo20032003, vol.52, no.5
Single-Clock, Single-Latch9 Scan DesignAmit M. Sheth; Jacob Savir20032003, vol.52, no.5
A Cost-Effective Wafer-Level Reliability Test System for Integrated Circuit MakersSummer Fan-Chung Tseng; Wei-Ting Kary Chien; Excimer Gong; Bing-Chu Cai20032003, vol.52, no.5
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