长垣产业园区科技文献服务平台

期刊


ISSN0018-9456
刊名IEEE Transactions on Instrumentation and Measurement
参考译名IEEE测试设备与测量汇刊
收藏年代1998～2013

关联期刊参考译名收藏年代
IEEE Transactions on Instrumentation and MeasurementIEEE测试设备与测量汇刊 


全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013

2002, vol.51, no.1 2002, vol.51, no.2 2002, vol.51, no.3 2002, vol.51, no.4 2002, vol.51, no.5 2002, vol.51, no.6

题名作者出版年年卷期
Comparative characteristics of thick-film integrated LC filtersVladan D. Desnica; Ljiljana D. Zivanov; Obrad S. Aleksic; Miloljub D. Lukovic; Miroslav D. Nimrihter20022002, vol.51, no.4
Measurement of multivariable frequency response functions in the presence of nonlinear distortions - some practical aspectsNele Dedene; Rik Pintelon; Philippe Lataire20022002, vol.51, no.4
The generation of binary and near-binary pseudorandom signals: an overviewAi Hui Tan; Keith R. Godfrey20022002, vol.51, no.4
Measuring frequency-and temperature-dependent permittivities of food materialsStuart O. Nelson; Philip G. Bartley, Jr.20022002, vol.51, no.4
Estimating wind speed in the lower atmosphere wind profiler based on a genetic algorithmYen-Wei Chen; Noel E. Mendoza; Zensho Nakao; Tatsuhiro Adachi20022002, vol.51, no.4
A test system for calibrating flickermetersRejean Arseneau; Michelle E. Sutherland; John J. Zelle20022002, vol.51, no.4
Velocity-dependent characteristics of modulated ultrasonic signal in gas flowMathias Niemann; Volker Hans20022002, vol.51, no.4
Model-based correction of coriolis mass flowmetersRalf Storm; Kourosh Kolahi; Helmut Rock20022002, vol.51, no.4
High-resolution electron microscopy: from imaging toward measuringSandra Van Aert; Arnold J. den Dekker; Adriaan van den Bos; Dirk Van Dyck20022002, vol.51, no.4
Strain measurement of moving periodic objects with optical sensorsChristian Berger20022002, vol.51, no.4
123456



国家科技图书文献中心  全球文献资源网  京ICP备05055788号-26  机械工业信息研究院 2018-2024