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期刊
ISSN
0018-9456
刊名
IEEE Transactions on Instrumentation and Measurement
参考译名
IEEE测试设备与测量汇刊
收藏年代
1998~2013
关联期刊
参考译名
收藏年代
IEEE Transactions on Instrumentation and Measurement
IEEE测试设备与测量汇刊
全部
1998
1999
2000
2001
2002
2003
2004
2005
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2007
2008
2009
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2013
2001, vol.50, no.1
2001, vol.50, no.2
2001, vol.50, no.3
2001, vol.50, no.4
2001, vol.50, no.5
2001, vol.50, no.6
题名
作者
出版年
年卷期
The relationship between microsystem technology and metrology
Reinoud F. Wolffenbuttel; Cees J. van Mullem
2001
2001, vol.50, no.6
IC fabrication-compatible processing for instrumentation and measurement applications
Davey D. L. Wijngaards; Reinoud F. Wolffenbuttel
2001
2001, vol.50, no.6
Testing of microanalysis system
Hans G. Kerkhoff
2001
2001, vol.50, no.6
Development of thin-film multijunction thermal converters at PTB/IPHT
Manfred Klonz; Hector Laiz; Ernst Kessler
2001
2001, vol.50, no.6
Stability of microelectromechanical devices for electrical metrology
Jukka Kyynarainen; Aarne S. Oja; Heikki Seppa
2001
2001, vol.50, no.6
Micromechanical voltage reference using the pull-in of a beam
Edmond Cretu; Luis Alexandre Rocha; Reinoud F. Wolffenbuttel
2001
2001, vol.50, no.6
Bulk micromachined electrostatic RMS-to-DC converter
Ger de Graaf; Marian Bartek; Z. Xiao; Cees J. van Mullem; Reinoud F. Wolffenbuttel
2001
2001, vol.50, no.6
Nanotechnology for next generation Josephson voltage standards
Samuel P. Benz; Paul D. Dresselhaus; Charles J. Burroughs, Jr.
2001
2001, vol.50, no.6
A silicon-etched probe for 3-D coordinate measurements with an uncertainty below 0.1 μm
Han Haitjema; Wouter Pril; P. H. J. Schellekens
2001
2001, vol.50, no.6
Low-cost satellite attitude control sensors based on integrated infrared detector arrays
A. W. van Herwaarden
2001
2001, vol.50, no.6
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