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期刊
ISSN
0957-0233
刊名
Measurement Science & Technology
参考译名
测量科学与技术
收藏年代
1990~2013
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2011, vol.22, no.1
2011, vol.22, no.10
2011, vol.22, no.11
2011, vol.22, no.12
2011, vol.22, no.2
2011, vol.22, no.4
2011, vol.22, no.5
2011, vol.22, no.6
2011, vol.22, no.7
2011, vol.22, no.8
2011, vol.22, no.9
题名
作者
出版年
年卷期
Scanning probe microscope dimensional metrology at NIST
John A. Kramar; Ronald Dixson; Ndubuisi G. Orji
2011
2011, vol.22, no.2
Nanometrology using a through-focus scanning optical microscopy method
Ravikiran Attota; Richard Silver
2011
2011, vol.22, no.2
Characterizing a scatterfield optical platform for semiconductor metrology
B. M. Barnes; R. Attota; R. Quintanilha; Y. J. Sohn; R. M. Silver
2011
2011, vol.22, no.2
Review of current progress in nanometrology with the helium ion microscope
Michael T. Postek; Andras Vladar; Charles Archie; Bin Ming
2011
2011, vol.22, no.2
Development of the metrology and imaging of cellulose nanocrystals
Michael T. Postek; Andras Vladar; John Dagata; Natalia Farkas; Bin Ming; Ryan Wagner; Arvind Raman; Robert J. Moon; Ronald Sabo; Theodore H. Wegner; James Beecher
2011
2011, vol.22, no.2
Combined scanning probe and light scattering characterization of multi-stage self-assembly of targeted liposome-based delivery systems
N. Farkas; J. A. Dagata; C. Yang; A. Rait; K. F. Pirollo; E. H. Chang
2011
2011, vol.22, no.2
The determination of the thickness of the silicon oxide film by synchrotron radiation X-ray photoelectron spectroscopy (SR-XPS) analysis
M. Imamura; N. Matsubayashi; J. Fan; I. Kojima; M. Sasaki
2011
2011, vol.22, no.2
Determination of the pore size distribution and porosity of porous low-dielectric-constant films by grazing incidence X-ray scattering
Y. Ito; K. Omote
2011
2011, vol.22, no.2
Evaluation of uncertainties in femtoampere current measurement for the number concentration standard of aerosol nanoparticles
Hiromu Sakurai; Kensei Ehara
2011
2011, vol.22, no.2
Primary standard for the number concentration of liquid-borne particles in the 10 to 20 μm diameter range
T. Sakaguchi; K. Ehara
2011
2011, vol.22, no.2
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