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期刊
ISSN
0957-0233
刊名
Measurement Science & Technology
参考译名
测量科学与技术
收藏年代
1990~2013
全部
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2009, vol.20, no.1
2009, vol.20, no.10
2009, vol.20, no.11
2009, vol.20, no.12
2009, vol.20, no.2
2009, vol.20, no.3
2009, vol.20, no.4
2009, vol.20, no.5
2009, vol.20, no.6
2009, vol.20, no.7
2009, vol.20, no.8
2009, vol.20, no.9
题名
作者
出版年
年卷期
A high precision micro/nano CMM using piezoresistive tactile probes
Gaoliang Dai; Sebastian Butefisch; Frank Pohlenz; Hans-Ulrich Danzebrink
2009
2009, vol.20, no.8
Coordinate metrology using scanning probe microscopes
F. Marinello; E. Savio; P. Bariani; S. Carmignato
2009
2009, vol.20, no.8
Design of a large measurement-volume metrological atomic force microscope (AFM)
Brian J. Eves
2009
2009, vol.20, no.8
Advanced three-dimensional scan methods in the nanopositioning and nanomeasuring machine
T. Hausotte; B. Percle; G. Jager
2009
2009, vol.20, no.8
A hybrid scanning probe microscope (SPM) module based on a DVD optical head
E. T. Hwu; H. Illers; L. Jusko; H. U. Danzebrink
2009
2009, vol.20, no.8
A two-dimensional atom encoder using one lateral-dithered scanning tunneling microscope (STM) tip and a regular crystalline lattice
Patamaporn Chaikool; Masato Aketagawa; Eiki Okuyama
2009
2009, vol.20, no.8
Local probe microscopy with interferometric monitoring of the stage nanopositioning
J. Lazar; P. Klapetek; O. Cip; M. Cizek; M. Sery
2009
2009, vol.20, no.8
A homodyne Michelson interferometer with sub-picometer resolution
Marco Pisani
2009
2009, vol.20, no.8
Common path two-wavelength homodyne counting interferometer development
Petr Kren; Petr Balling
2009
2009, vol.20, no.8
A new high-aperture 193 nm microscope for the traceable dimensional characterization of micro- and nanostructures
G. Ehret; F. Pilarski; D. Bergmann; B. Bodermann; E. Buhr
2009
2009, vol.20, no.8
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