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期刊
ISSN
0957-0233
刊名
Measurement Science & Technology
参考译名
测量科学与技术
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1990~2013
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2006, vol.17, no.1
2006, vol.17, no.10
2006, vol.17, no.11
2006, vol.17, no.12
2006, vol.17, no.2
2006, vol.17, no.3
2006, vol.17, no.4
2006, vol.17, no.5
2006, vol.17, no.6
2006, vol.17, no.7
2006, vol.17, no.8
2006, vol.17, no.9
题名
作者
出版年
年卷期
Selected examples of intelligent (micro) sensor systems: state-of-the-art and tendencies
Peter R. Hauptmann
2006
2006, vol.17, no.3
Recent advances on traceable nanoscale dimension and force metrology in the UK
Richard Leach; Derek Chetwynd; Liam Blunt; Jane Haycocks; Peter Harris; Keith Jackson; Simon Oldfield; Simon Reilly
2006
2006, vol.17, no.3
3D roughness evaluation of cylinder liner surfaces based on structure-oriented parameters
A. Weidner; J. Seewig; E. Reithmeier
2006
2006, vol.17, no.3
Investigation of some critical aspects of on-line surface measurement by a wavelength-division-multiplexing technique
Xiangqian Jiang; Dejiao Lin; Liam Blunt; Wei Zhang; Lin Zhang
2006
2006, vol.17, no.3
Measuring ultra-precision freeform surfaces using a robust form characterization method
C. F. Cheung; Huifen Li; Lingbao Kong; W. B. Lee; S. To
2006
2006, vol.17, no.3
A nanoindentation instrument for mechanical property measurement of 3D micro/nano-structured surfaces
T. Motoki; W. Gao; S. Kiyono; T. Ono
2006
2006, vol.17, no.3
Correlation of topography measurements of NIST SRM 2460 standard bullets by four techniques
J. Song; T. Vorburger; T. Renegar; H. Rhee; A. Zheng; L. Ma; J. Libert; S. Ballou; B. Bachrach; K. Bogart
2006
2006, vol.17, no.3
Probing systems for dimensional micro- and nano-metrology
A. Weckenmann; G. Peggs; J. Hoffmann
2006
2006, vol.17, no.3
A new type of three-finger micro-tweezers
Hao Xing; Yang Zhang; Wenhao Huang
2006
2006, vol.17, no.3
Real-time atomic encoder using scanning tunnelling microscope and regular crystalline surface
M. Aketagawa; K. Takada; P. Rerkkumsup; Y. Togawa; H. Honda
2006
2006, vol.17, no.3
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