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期刊
ISSN
0957-0233
刊名
Measurement Science & Technology
参考译名
测量科学与技术
收藏年代
1990~2013
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2000, vol.11, no.1
2000, vol.11, no.10
2000, vol.11, no.11
2000, vol.11, no.12
2000, vol.11, no.2
2000, vol.11, no.3
2000, vol.11, no.4
2000, vol.11, no.5
2000, vol.11, no.6
2000, vol.11, no.7
2000, vol.11, no.8
2000, vol.11, no.9
题名
作者
出版年
年卷期
A highly accurate iterative PIV technique using a gradient method
Yasuhiko Sugii; Shigeru Nishio; Taketoshi Okuno; Koji Okamoto
2000
2000, vol.11, no.12
A noise reduction technique for on-line detection and location of partial discharges in high voltage cable networks
I. Shim; J. J. Soraghan; W. H. Siew
2000
2000, vol.11, no.12
A novel high temperature NMR probe design: application to 17{sup left}O studies of gel formation of zirconia
I. J. F. Poplett; M. E. Smith; J. H. Strange
2000
2000, vol.11, no.12
A remote acceptance probe and illumination configuration for spectral assessment of internal attributes of intact fruit
Colin V. Greensill; Kerry B. Walsh
2000
2000, vol.11, no.12
An auger electron-threshold photoelectron coincidence spectrometer for studies of atomic and molecular dications
Yasumasa Hikosaka; Francis Penent; Pascal Lablanquie; Richard Hall; Kenji Ito
2000
2000, vol.11, no.12
An error-model study of a new type of coordinate-measuring machine based on the parallel-link mechanism
Dejun Liu; Rensheng Che; Qingcheng Huang; Dong Ye
2000
2000, vol.11, no.12
Angular profiles of molecular beams from effusive tube sources: I. experiment
F. Rugamas; D. Roundy; G. Mikaelian; G. Vitug; M. Rudner; J. Shih; D. Smith; J. Segura; M. A. Khakoo
2000
2000, vol.11, no.12
Compact optical trapping microscope using a diode laser
Z. Ulanowski; I. K. Ludlow
2000
2000, vol.11, no.12
Fast trace humidity generation in the 0.1 ppm to 1000 ppm range with a two-stage dilution and mixing generator
Holger Venzke; Bernd Schirmer; Martin Still; Adrian Melling; Franz Durst
2000
2000, vol.11, no.12
Interferometric determination of the refractive index of liquid sulphur dioxide
M. Musso; R. Aschauer; A. Asenbaum; C. Vasi; Emmerich Wilhelm
2000
2000, vol.11, no.12
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