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期刊


ISSN1084-4309
刊名ACM Transactions on Design Automation of Electronic Systems
参考译名ACM电子系统自动化设计汇刊
收藏年代2000～2023



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2019, vol.24, no.1 2019, vol.24, no.2 2019, vol.24, no.3 2019, vol.24, no.4 2019, vol.24, no.5 2019, vol.24, no.6

题名作者出版年年卷期
CAD-Base: An Attack Vector into the Electronics Supply ChainBasu, Kanad; Saeed, Samah Mohamed; Pilato, Christian; Ashraf, Mohammed; Nabeel, Mohammed Thari; Chakrabarty, Krishnendu; Karri, Ramesh20192019, vol.24, no.4
On Chip Reconfigurable CMOS Analog Circuit Design and Automation Against Aging Phenomena: Sense and ReactAfacan, Engin; Dundar, Gunhan; Baskaya, Faik; Pusane, Ali Emre; Yelten, Mustafa Berke20192019, vol.24, no.4
Layout Resynthesis by Applying Design-for-manufacturability Guidelines to Avoid Low-coverage Areas of a Cell-based DesignWang, Naixing; Pomeranz, Irith; Reddy, Sudhakar; Sinha, Arani; Venkataraman, Srikanth20192019, vol.24, no.4
MEMS-IC Robustness Optimization Considering Electrical and Mechanical Design and Process ParametersBurcea, Florin; Herrmann, Andreas; Li, Bing; Graeb, Helmut20192019, vol.24, no.4
Fault Tolerance Technique Offlining Faulty Blocks by Heap Memory ManagementJun, Jaeyung; Paik, Yoonah; Min, Gyeong Il; Kim, Seon Wook; Han, Youngsun20192019, vol.24, no.4
Cross-point Resistive Memory: Nonideal Properties and SolutionsWang, Chengning; Feng, Dan; Tong, Wei; Liu, Jingning; Li, Zheng; Chang, Jiayi; Zhang, Yang; Wu, Bing; Xu, Jie; Zhao, Wei; Li, Yilin; Ren, Ruoxi20192019, vol.24, no.4
Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among MeasurementsLi, Yanjun; Yilmaz, Ender; Sarson, Pete; Ozev, Sule20192019, vol.24, no.4
Analysis of Dissipative Losses in Modular Reconfigurable Energy Storage Systems Using SystemC TLM and SystemC-AMSZimmermann, Thomas; Mora, Mathias; Steinhorst, Sebastian; Mueller-Gritschneder, Daniel; Jossen, Andreas20192019, vol.24, no.4
Share-n-Learn: A Framework for Sharing Activity Recognition Models in Wearable Systems With Context-Varying SensorsRokni, Seyed Ali; Ghasemzadeh, Hassan20192019, vol.24, no.4
Compiler-Assisted and Profiling-Based Analysis for Fast and Efficient STT-MRAM On-Chip Cache DesignSayed, Nour; Mao, Longfei; Bishnoi, Rajendra; Tahoori, Mehdi B.20192019, vol.24, no.4



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