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期刊


ISSN1084-4309
刊名ACM Transactions on Design Automation of Electronic Systems
参考译名ACM电子系统自动化设计汇刊
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024


题名作者出版年年卷期
Realizing In-Memory Computing using Reliable Differential 8T SRAM for Improved LatencyAYUSH DAHIYA; POORNIMA MITTAL; RAJESH ROHILLA20242024, vol.29, no.6
An Efficient Method of DRC Violation Prediction with a Serial Deep Learning ModelJINGUI LIN; WENXIONG LIN; SHIYAN LIANG; PENG GAO; YAN XING; TINGTING WU; XIAOMING XIONG; SHUTING CAI20242024, vol.29, no.6
Assertion-Based Validation using Clustering and Dynamic Refinement of Hardware CheckersSAHAN SANJAYA; HASINI WITHARANA; PRABHAT MISHRA20242024, vol.29, no.6
MCMCF-Router: Multi-capacity Ordered Escape Routing Algorithms for Grid/Staggered Pin ArrayZHENYI GAO; SHEQIN DONG; ZHICONG TANG; WENJIAN YU20242024, vol.29, no.6
Placement Flow Study and Detailed Placement for Hybrid-Row-Height DesignsWEI-KAI FANG; WAI-KEI MAK20242024, vol.29, no.6
Transfer Learning Enabled Modeling Paradigm for PVT-aware Circuit Performance EstimationDEEPTHI AMURU; RAJA MAVULLU VECHALAPU; ZIA ABBAS20242024, vol.29, no.6
ZeroD-fender: A Resource-aware IoT Malware Detection Engine via Fine-grained Side-channel AnalysisZHUORAN LI; DANELLA ZHAO20242024, vol.29, no.6
A Bridge-based Algorithm for Simultaneous Primal and Dual Defects Compression on Topologically Quantum-error-corrected CircuitsWEI-HSIANG TSENG; YAO-WEN CHANG20242024, vol.29, no.6
Automatic Test Pattern Generation for Robust Quantum Circuit TestingKEAN CHEN; MINGSHENG YING20242024, vol.29, no.6
AmLuCEP: Amalgamating LUT-based Compression and Adaptive Encoding Assisted Block Placement To Improve Lifetime of PCM-based Main MemoriesARIJIT NATH; HEMANGEE K. KAPOOR20242024, vol.29, no.6
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