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期刊


ISSN1084-4309
刊名ACM Transactions on Design Automation of Electronic Systems
参考译名ACM电子系统自动化设计汇刊
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023

2013, vol.18, no.1 2013, vol.18, no.2 2013, vol.18, no.3 2013, vol.18, no.4

题名作者出版年年卷期
On Bottleneck Analysis in Stochastic Stream ProcessingRAJ RAO NADAKUDITI; IGOR L. MARKOV20132013, vol.18, no.3
How to Efficiently Implement Dynamic Circuit Specialization SystemsFATMA ABOUELELLA; TOM DAVIDSON; WIM MEEUS; KAREL BRUNEEL; DIRK STROOBANDT20132013, vol.18, no.3
Thread-Based Multi-Engine Model Checking for Multicore PlatformsGIANPIERO CABODI; SERGIO NOCCO; STEFANO QUER20132013, vol.18, no.3
Analysis and Minimization of Power-Transmission Loss in Locally Daisy-Chained Systems by Local Energy BufferingSEHWAN KIM; PAI H. CHOU20132013, vol.18, no.3
Employing Circadian Rhythms to Enhance Power and ReliabilitySAKET GUPTA; SACHIN S. SAPATNEKAR20132013, vol.18, no.3
Routability Optimization for Crossbar-Switch Structured ASIC DesignMEI-HSIANG TSAI; PO-YANG HSU; HUNG-YI LI; YI-HUANG HUNG; YI-YU LIU20132013, vol.18, no.3
Agglomerative-Based Flip-Flop Merging and Relocation for Signal Wirelength and Clock Tree OptimizationSEAN SHIH-YING LIU; WAN-TING LO; CHIEH-JUI LEE; HUNG-MING CHEN20132013, vol.18, no.3
An Efficient Method for Analyzing On-Chip Thermal Reliability Considering Process VariationsYU-MIN LEE; PEI-YU HUANG20132013, vol.18, no.3
Order Statistics for Correlated Random Variables and Its Application to At-Speed TestingYIYU SHI; JINJUN XIONG; VLADIMIR ZOLOTOV; CHANDU VISWESWARIAH20132013, vol.18, no.3
Power-Safe Application of TDF Patterns to Flip-Chip Designs during Wafer TestWEI ZHAO; JUNXIA MA; MOHAMMAD TEHRANIPOOR; SREEJIT CHAKRAVARTY20132013, vol.18, no.3
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